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研究生: 陳上揚
論文名稱: CMOS雙軸掃描鏡之迴授控制
Closed-loop Control of a Bi-axial CMOS Scanning Mirror
指導教授: 盧向成
LU, SHIANG-CHENG
口試委員: 李銘晃
Li, Ming-Huang
陳宗麟
Chen, Tsung-Lin
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 電子工程研究所
Institute of Electronics Engineering
論文出版年: 2025
畢業學年度: 113
語文別: 中文
論文頁數: 100
中文關鍵詞: 微機電投影電磁式掃描鏡壓阻感測控制系統
外文關鍵詞: MEMS Projection, Electromagnetic, Scanning Mirror, Piezoresistive Sensing, Control system
相關次數: 點閱:8下載:0
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  • 本研究期望設計一個應用於投影系統的電磁式驅動微機電掃描鏡,相較於其
    他應用,此研究希望製作出擁有較大轉動角度的掃描鏡,為了感測結構轉動時的角度,所以利用多晶矽及N-well製作壓阻轉角感測器,透過掃描鏡轉動帶動壓阻產生形變,使壓阻阻值變化,進而產生電壓訊號以進行轉角感測。
    本研究使用TSMC 2P4M 0.35 μm製程,將電磁式驅動掃描鏡結構及轉角感測電路整合於單一晶片上,晶片面積6.4mm × 5.8 mm,經量測後得到快軸反相位擺動模態的共振頻率為31392 Hz、慢軸扭轉模態的共振頻率為1788 Hz,在慢軸扭轉模態下,驅動電流為2.568 mApp時,慢軸光學轉角約為18.56°、在快軸反相位擺動模態下,驅動電流為31.81 mApp時,快軸光學轉角可達19.66°,規格符合SVGA的標準。感測電路部分則完成以壓阻感測器感測結構轉動角度並驗證以45°N-well作為壓阻材料的感測器其感測度最高。為了解此結構受到空氣阻力影響的程度,將掃描鏡置於壓力腔並將氣壓下降至0.03大氣壓的環境後,慢軸扭轉與快軸反相位擺動的品質參數變為798和4056。最後本研究分別使用lock-in Amplifier和電路實現閉迴路控制系統。在快軸反相位擺動模態中,使用PI控制能大幅降低頻率與振幅的艾倫方差,在慢軸扭轉模態閉迴路步階響應中,其穩態誤差為71 %、過衝28%、以及上升時間360 μs。


    An electromagnetically driven scanning mirror is studied in this thesis for application in a projector system. The scanning mirror is desired to have a larger mirror rotation angle than those for other applications. In order to sense the rotation angle, piezoresistive sensors made of polysilicon and N-well are deposited on the structure. The piezoresistives change associated with the rotation angle is converted to a voltage signal by on-chip circuits.
    In this study, the TSMC 2P4M 0.35 μm process was used to integrate the electromagnetically driven scanning mirror and the sensing circuit on a chip, with a chip area of 6.4 mm × 5.8 mm. The measured slow- and fast-axis resonant frequencies are 1788 Hz and 31392 Hz, respectively. The slow- and fast-axis optical angle are 18.56° and 19.66° at the driving currents of 2.568 mApp, and 31.81 mApp, respectively. The design meets the projector SVGA specifications for the projector application. As for the sensing performance, the sensitivity of 45° N-well piezoresistor is the highest. To understand the extent to which this structure is affected by air resistance, places the scanning mirror in a pressure chamber and the pressure was reduced to 0.03 atmospheres, the Quality Factors for slow-axis torsional mode and fast-axis out-of-phase become 798 and 4056, respectively. Finally, closed-loop control system of 2 modes were implemented using Lock-in amplifier and circuitry. In the fast-axis out-of-phase mode, PI control significantly reduced the Allan deviation of both frequency and amplitude. In the closed-loop step response of the slow-axis torsional mode, the steady-state error was 71%, with overshoot 28%, and a rise time of 360 μs.

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