研究生: |
鄒育奇 Yu-Qi Zou |
---|---|
論文名稱: |
氧在Mo(110)表面上的吸附 Adsorption of oxygen on Mo(110) surface |
指導教授: |
羅榮立
Rong-Li Lo |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
理學院 - 物理學系 Department of Physics |
論文出版年: | 2006 |
畢業學年度: | 94 |
語文別: | 中文 |
論文頁數: | 83 |
中文關鍵詞: | 氧在Mo(110)表面上的吸附 |
外文關鍵詞: | Adsorption of oxygen on Mo(110) surface |
相關次數: | 點閱:44 下載:0 |
分享至: |
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
以低能量電子繞射儀(LEED)和掃描穿隧顯微儀(STM)研究鉬(110)面上的氧吸附結構。在室溫下曝氧,低曝量時發現三種有序相表面結構,依次為0.25ML的(2x2)、0.5ML的(1x2)或(2x1)及0.75ML的(2x2)。在高曝量時,表面也存在著某種結構。實驗中在曝氧後進行400K和500K退火,可以獲得較清晰的繞射圖像,與分佈較均勻的表面結構。而在樣品溫度為400K及500K下進行曝氧動作,除了獲得更尖銳的LEED圖像外,在高曝量時會出現複雜LEED圖像,以及特殊的表面結構。這項研究還有另外一個目的,由於鎢和鉬金屬同為bcc結構,因此藉由這個機會,比較氧在鉬(110)面上與鎢(110)面上的吸附差異性。
The surface structures of oxygen adsorbed on Mo(110) was studied by low energy electron diffraction (LEED) and scanning tunneling microscopy (STM).At lower exposure of oxygen three phases of the surface structure were found at room temperature. They were 41ML-(2x2), 21ML-(1x2) or (2x1),and 43ML-(2x2) structures. Some complex structures appeared at high exposures. Sharper LEED patterns and uniform surface structures might be obstained after post-annealing to 400K and 500K.While exposing 400K or 500K Mo(110) to oxygen, we could obtain not only sharper LEED patterns but also complex LEED patterns and surface structures at high exposures. The research has another goal. Owing to the fact that W and Mo are metals of bcc structure, comparison of oxygen adsorption on Mo(110) with W(110) was carried out in the study.
﹝1﹞ K. HAYEK, H.E. FARNSWORTH,and R.L. PARK, Surf.Sci.,10(1968)429.
﹝2﹞ H.M. KENNETT,and A.E. LEE, Surf.Sci.,48(1975)591.
﹝3﹞ E. BAUER,and H. POPPA, Surf.Sci.,127( 1983)243.
﹝4﹞ B. Dijnweg, A. Milchev,and P. A. Rikvold, J.Chem.Phys, 94(1991)3958.
﹝5﹞ M.L. Colaianni, J.G. Chen I, W.H. Weinberg and J.T. Yates, Jr., Surf.Sci.,279(1992)211.
﹝6﹞ M. Kamei, T. Obayashi, Y. Tanaka, and Y. Gotoh,Surf.Sci., 356(1996)137.
﹝7﹞ J. Kroger, S. Lehwald, and H. Ibach, Phys.Rev.B,58(1998)3.
﹝8﹞ Jorg Kroger , Thomas Greber,and Jurg Osterwalder, Surf.Sci., , 459(2000)173.
﹝9﹞ K.E. Johnson, R.J. Wilson,and S. Chiang,Phys.Rev.Lett., 71(1993) 7 1055.
﹝10﹞林藝暐,2004,東華大學應用物理研究所碩士論文,2-4節,p14。
﹝11﹞L Morales de la Garza,and L J Clarke, J. Phys. C: Solid State Phys., 14(1981)5391.
﹝12﹞T.W. Haas, A.G. Jackson, J.Chem.Phys., 44(1966)8 2921.
﹝13﹞E. BAUER,and T. ENGEL, Surf. Sci., 71(1978)695.
﹝14﹞奈米尺寸的新型量測設備與製程< http://nano.phys.nthu.edu.tw/tzeng/ nanomanufacturing.pdf >圖二(a)
﹝15﹞G. Binnig,and H. Rohrer,Helv.Phys.Acta, 55(1982)726.
﹝16﹞J.C. Vickerman, Surface Analysis,1998,p396
﹝17﹞黃英碩,表面物理講義, surface_science2003_SPM,p2。
﹝18﹞J. Tersoff,and D.R. Hamann, Phys.Rev.B, 50(1985)1998.
﹝19﹞奈米尺寸的新型量測設備與製程< http://nano.phys.nthu.edu.tw/tzeng/ nanomanufacturing.pdf >圖二(b)
﹝20﹞黃英碩,表面物理講義, surface_science2003_SPM,p4。
﹝21﹞C.Bai, Scanning Tunneling Microscopy and Its Applications,Version 2.0,jan.2000,p72
﹝22﹞呂助增,掃描式探針顯微鏡檢測技術基本原理與操作模式介紹,p16,p17。
﹝23﹞C.Bai, Scanning Tunneling Microscopy and Its Applications,Version 2.0,jan.2000,p64。
﹝24﹞黃惠忠,2003,奈米材料分析:第二章,p18。
﹝25﹞C.Bai, Scanning Tunneling Microscopy and Its Applications,Version 2.0,jan.2000,p75。
﹝26﹞Edited by A. Joseph and J. William, Scanning Tunneling Microscopy, p61。
﹝27﹞黃惠忠,2003,奈米材料分析:第二章,p19。
﹝28﹞J.C. Vickerman,Surface Analysis,1998,p417。
﹝29﹞S.Y. Tong,and Plog., Surf.Sci., 7(1975)1.
﹝30﹞John B. Hudson,Surface Science An Introduction,1991,p9。
﹝31﹞John B. Hudson,Surface Science An Introduction,1991,p10。
﹝32﹞The School of Biological & Chemical Sciences at Queen Mary University of London , <http://www.chem.qmul.ac.uk/surfaces/scc/scat6_2.htm>
﹝33﹞陳尚文,2004,清華大學碩士論文,2-2節,p18。
﹝34﹞John B. Hudson,Surface Science An Introduction,1991,p11。
﹝35﹞黃英碩,表面物理講義, surface_science_structure2004,p62。
﹝36﹞Varian, Inc. Vacuum Techologies, Ion Pumps, Turbo-V Pumps.
﹝37﹞Varian, Vacuum Techologies, SH-110 Dry Scroll Vacuum Pump Manual, July 2005.
﹝38﹞SPECTALEED, OMICRON NANO TECHNOLOGY <http://www.omicron.de/index2.html>
﹝39﹞VT UHV SPM, OMICRON NANO TECHNOLOGY <http://www.omicron.de/index2.html>
﹝40﹞Omicron NanoTechnology, VT Beam Deflection AFM Users Guide & Service Manual, ver.2, 2001, p30.
﹝41﹞Omicron NanoTechnology, VT Beam Deflection AFM Users Guide & Service Manual, ver.2, 2001, p21.
﹝42﹞Omicron Istruments For Surface Science,The VT Beam Deflection AFM Users Guide & Service Manual, ver.1, 2000, (a)p45,(b)p54,(c)p136
﹝43﹞Omicron Nano Technology, SPECTALEED Optics and Electron Gun Users Guide,Version 4.0, 1999, p.7.
﹝44﹞J.P. Ibe, P.P. Bey Jr., S.L. Brandov, R.A. Brizzolare, N.A. Burnham, D.P. Di-Lett, K.P. Lee, C.R.K. Marrian, R.J. Colton, J. Vac. Sci. Technol., A8(1990)3570.
﹝45﹞J.G. Chen, B. Fruhberger, Joseph Eng Jr.,and B.E. Bent, J.Mole. Catal. A, Chemical, 131(1998)285.
﹝46﹞C.Lebreton, Z.Z. Wang, Surf.Sci., 382(1997)193.