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研究生: 郭宏泰
Kuo, Hung-Tai
論文名稱: 應用精實六標準差於作業流程改善-以半導體WAT測試為例
Application of Lean Six Sigma for Process Improvement - A Case Study of Wafer Acceptance Test
指導教授: 陳建良
Chen, James C.
口試委員: 陳子立
Chen, Tzu-Li
羅明琇
Lo, Sonia M.
學位類別: 碩士
Master
系所名稱: 工學院 - 工業工程與工程管理學系碩士在職專班
Industrial Engineering and Engineering Management
論文出版年: 2017
畢業學年度: 105
語文別: 中文
論文頁數: 77
中文關鍵詞: 半導體精實六標準差價值溪流圖關聯規則
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  • 隨著消費市場電子產品生命週期越來越短,對於上游製造端半導體代工的生產週期時間的改善越來越顯得重要。由東方的精實生產管理哲學,加上西方透過數據分析與具體改善架構的六標準差手法,兩者互補結合成為新手法精實六標準差,其適用範圍廣泛且成效卓越,能夠有效的聚焦於顧客需求進行改善,可說是目前管理階層所仰賴的秘帖良方;無論品質強化、流程改善、成本降低或上述提及生產週期時間降低等,均有大量文獻反應其精實六標準差手法之適用性。

    本研究為運用精實六標準差手法,改善半導體WAT測試流程為研究對象。藉由DMAIC流程與價值溪流圖等工具,探討流程步驟潛在的浪費作業,尋找出改善機會點並加以分析改善作法。對於材料與機台最適化,導入資料探勘中關聯規則手法,建立配對規則,增加產出效益。

    除流程步驟改善優化外,研究過程中,也發現流程中存在需人工操作之低效率作業內容,並提出解決方案改善;另外透過標竿學習發現作業環境的改善機會點,大幅提升檢驗性質流程的成功率並降低作業負擔。

    經由以上改善方案導入並實施標準化維持成效,個案PCE改善幅度達25.51%,每年節省金額407萬,有效簡化作業流程並且提升個案公司競爭力。


    As the life cycles of electricity products in market becoming shorter and shorter, the improvement of the production cycle time of the Semiconductor foundry of upstream manufacturing end has become more and more important. With the integration of lean production management philosophy from the Eastern cultures and data analyses from the Western cultures, the architectures of Six Sigma were improved concretely via the complementary combination to form the new approach: Lean Six Sigma. The broad scope of applications and excellent performance made Lean Six Sigma approach to effectively focus on the demands of customers for further improvement, which could be regarded as the secret keys for management fields for the time being in the perspectives of quality improvement, process improvement, cost reduction, or shortening of the production cycle time mentioned above. There were plenty of literatures showing the applicability of Lean Six Sigma approach.

    Six sigma approaches was used in this study and the improvement of semiconductor WAT testing procedures were chosen as the research object. With DMAIC procedures and tools such as Value Stream Mapping, etc., the potential waste of works were investigated to find out the improvement opportunities and analyze the real reasons before trying the improvement approaches in practice and conforming the effects.
    In the research procedures, the association rules of data exploration were tried to establish the matching rules between materials and manufacturing machines to increase the output efficiency.

    In addition to the optimization of steps in processes, certain inefficient processing contents dependent on manual operation in the processes were also found in this study and the corresponding solutions for the improvement werer also provided. The improvement opportunities in the processing environment were also found via the benchmarking to largely elevate the success rates of the inspection processes and lower the operating burdens.

    Introduction of the improvement solutions mentioned above and implementation of standardized processes ensure the maintenance of effectiveness. After improvement, the PCE of the research objects has improved 25.51% and saved up to 4,700,000 NTDs, which could effectively simplify the work flows and further elevate the competiveness of companies.

    摘要....i Abstract....ii 誌謝....iv 目錄....v 圖目錄....vii 表目錄....ix 第一章 緒論....1 1.1 研究背景....1 1.2 研究動機....2 1.3 研究目的....4 1.4 研究範圍....5 1.5 研究方法....5 1.6 研究架構....5 第二章 文獻回顧....7 2.1 生產週期時間說明....7 2.2 精實生產....7 2.2.1精實生產發展過程....8 2.2.2精實生產說明....10 2.3 六標準差....14 2.4 精實六標準差....16 2.4.1精實六標準差說明....17 2.4.2精實六標準差之應用與導入....19 2.4.2精實六標準差之應用實績....23 第三章 研究方法....28 第四章 個案分析....32 4.1 半導體(Semiconductor)....32 4.2 晶圓允收測試WAT(Wafer Acceptance Test....35 4.3 應用精實六標準差改善WAT流程....37 4.3.1 個案背景....37 4.3.2 定義(Define)....39 4.3.3 衡量(Measure)....42 4.3.4 分析(Analyze)....44 4.3.5 改善(Improve)....51 4.3.6 控制(Control)....63 第五章 結論與未來研究方向....67 參考文獻....71

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    [網頁部分]
    陳良榕(2017)。台積電首度公開智慧製造 張忠謀、魏哲家最關心的神秘數字。天下雜誌。 取自http://www.cw.com.tw/article/article.action?id=5082780&utm_source=Facebook&utm_medium=Social&utm_campaign=Daily
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