隨著科技產業輕薄化的潮流，各種科技產品以輕、薄為主要設計概念，然而產品的輕薄化卻造成許多未曾考慮的問題一一浮現，例如薄膜電晶體液晶顯示器(Thin Film Transistor-Liquid Crystal Display, TFT-LCD)所使用的玻璃基板中之殘留應力即為一重大課題，雖然光彈法為非破壞性之應力檢測方法，但玻璃基板輕薄化將造成光彈效應漸趨微弱，使得傳統光彈法之敏感度已不敷使用。本研究將光彈法與光譜儀做結合，利用光譜儀高解析度的特點提升光彈法的檢測解析度，並針對PSM-1光彈材料製作之試片進行光彈拉伸實驗，觀察由光譜儀所得光譜分析圖的變化趨勢，嘗試經由觀察光譜分析圖隨應力的變化趨勢以建立應力判斷規則；另一方面，經由Mueller矩陣進行白光光彈理論的推導，利用PSM-1光彈材料之應力光學係數與波長的關係式以及考慮白光干涉造成的影響，求取光譜儀所檢測光強度之理論值，將理論值及實驗值相比較以探討白光光彈理論的正確性。

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