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研究生: 張羅嶽
Chang, Lo-Yueh
論文名稱: 非接觸式化學微影應用於矽烷分子的研究
The Study of Non-Contact Chemical Lithography for Silane Derived Molecules
指導教授: 果尚志
Gwo, S.
陳家浩
Chen, C.-H.
口試委員:
學位類別: 碩士
Master
系所名稱: 理學院 - 物理學系
Department of Physics
論文出版年: 2009
畢業學年度: 97
語文別: 中文
論文頁數: 58
中文關鍵詞: 自組裝分子膜有機薄膜表面改質置換反應電子束改質微影X光改質
外文關鍵詞: self-assembled monolayers, SAM, exchanged reaction, surface modification
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  • 自組裝分子膜(Self-assembled monolayers, SAMs)經由頭端官能基以化學吸附的方式成長於基板之上,其特性為緻密堆積成長使之擁有良好的規則性二維平面。因此可以利用自組裝分子膜改變金屬、半導體與氧化物等表面性質。近年來已可將成長於金上的自組裝分子膜進行有效的置換反應,且吸引眾人目光。故若能將此技術應用於改質半導體材料的表面特性,將會更加具有實際的應用價值。

    為了達此目的,我們將利用聚焦X光與電子束轟擊成長在矽基板表面的自組裝分子膜。並藉由水滴接觸角、掃描式電子顯微鏡、高解析光電子能譜與掃描式光電子能譜術等技術研究改質過程。在經過轟擊聚焦X光或電子束的區域將變得具有活性。此時再成長第二種末端官能基為胺基的自組裝分子於轟擊區域,而胺基的官能基會因靜電吸引力吸附奈米金顆粒在此區域。因此可藉由掃描式電子顯微鏡與掃描式光電電子能譜術觀測奈米金顆粒吸附情形加以驗證微區域改質情況。


    Self-assembled monolayers (SAMs) are organic molecules chemisorbed on a substrate surface by a suitable headgroup and formed a well-ordered densely packed 2-dimensional layer. It provides an easy way to modify the surface properties of metal, semiconductor and oxide surfaces. Recently, an exchanging process of different SAMs grown on gold substrate has attracted a lot of attention. Hence, in order to achieve higher technological impact, the exchange reaction occurs on semiconductor surface will be more desirable.

    To realize this purpose, we have applied focused soft X-ray and electron beam to pattern silane derived SAM grown on silicon oxide surfaces. The modified surface was then studied by water contact angle, scanning electron microscopy (SEM) and synchrotron radiation based high-resolution X-ray photoelectron spectroscopy (HRXPS). After focused photon and electron beam irradiation, a surface activation procedure was followed to regenerate active surface at the patterned areas. A second SAM with amino functional group was successfully implanted on the patterned areas. This reaction was confirmed by scanning photoelectron microscopy (SPEM) and SEM through gold nanopaticles absorption.

    摘要 i 致謝 iii 目錄 iv 圖目錄 vi 一、前言 1 二、文獻回顧與實驗動機 5 2-1 自組裝分子膜(self-Assembled Monolayers) 5 2-2 自組裝分子的圖形化過程(patterning process) 6 2-3 實驗動機與研究方法 9 三、儀器簡介 10 3-1 同步輻射簡介 10 3-2 同步輻射原理 11 3-3 X光光電子能譜術(X-ray Photoemission Spectroscopy,XPS) 13 3-4 掃描式光電子顯微儀(Scanning Photoelectron Microscopy,SPEM) 18 3-5 掃描式電子顯微鏡(Scanning Electron Microscope,SEM) 20 四、實驗步驟與分析方法 22 4-1 實驗藥品 22 4-2 實驗步驟 24 4-2-1 樣品清洗與製備 24 4-2-2 SAMs樣品成長 25 4-2-3 掃描式電子顯微鏡量測 26 4-2-4 掃描式光電子顯微鏡 27 4-2-5 X光光電子能譜術 27 4-2-6 接觸角量測 28 五、實驗結果與討論 29 5-1 基材的前處理 29 5-2 SAMs基本性質分析 31 5-2-1 OTS基本特性 32 5-2-2 APTMS基本特性 34 5-3 OTS經由電子束或X光改質 36 5-3-1 OTS經由電子束轟擊改質反應 36 5-3-2 OTS經由聚焦X光轟擊改質反應 38 5-4 OTS與APTMS相互影響關係 40 5-5 置換反應 42 5-5-1 以聚焦X光引發置換反應 42 5-5-2 以聚焦電子束引發置換反應 43 5-5-3 以物理或化學方式改善局域改質 45 5-5-3-1 以物理方式改善局域性的改質 46 5-5-3-2 以化學方式改善局域性的改質 47 六、結論 54 參考文獻 56

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