超級電容器具有大電流快速充放電以及大容量的電氣特性，為一新世代的儲能元件，目前全球各家超級電容器製造廠在市場上所宣稱的產品壽命皆為10年，唯至目前並無任何廠商提出完整的實證資料作為保證的依據。
為嘗試建構超級電容適用之壽命時間預測模型，本研究以超級電容器作為研究對象，並依超級電容器設計使用時的主要二大條件：負載額定電壓與環境溫度作為環境應力規劃執行超級電容器的加速壽命試驗，來達到期望的設定時間內使產品發生劣化最終導致失效的目的，透由失效數據的分析，除可瞭解電壓與溫度對於超級電容器壽命的影響外，亦可推估得出超級電容器在正常使用環境與條件使用下之平均壽命時間。
研究中以複合應力模型（Combination model）規劃不同的環境溫度與電壓設定條件進行加速壽命試驗，定義電容量衰退幅度超過30%為試驗終止條件並作為試驗終止的依據，接著進行失效數據分析，分別探討溫度與電壓對於超級電容器壽命的影響並計算得出活化能Ea與係數m，最終完成複合應力模型的建構並求出各溫度、電壓條件下之加速因子，進而推估出超級電容器正常使用以及個別設定溫度與電壓條件下的平均壽命時間。

As the next generation of energy storage component, supercapacitors has the characteristic of high capacitance with quick charge/discharge under high current. Although major manufacturers around the globe claim supercapacitor can operate for 10 years, none of them has provided complete empirical data as hard supporting evidence.
In order to build a suitable life prediction model for supercapacitor, this research uses two major factors from designing phase; rated load voltage and ambient temperature; as the condition of environmental stress plan to perform accelerated life test in hoping to get product deterioration and eventual failure in set time. 30% of capacitance decay is set as the basis of test termination. Activation energy Ea and coefficient m is then calculated and used to complete the construction of stress model.
In the end, through failure analysis, we not only get to understand how voltage and temperature affects the life of supercapacitor, but also can estimate its average life expectancy under normal and specific condition.

中文部分
1.王宗華﹙2012﹚，「可靠度工程與管理」，中華民國品管學會，台北市。
2.林自立﹙2011﹚，「加速壽命試驗之可靠度評估-以液晶顯示器源極驅動IC為例」，明新科技大學碩士論文，新竹縣。
3.柯煇耀﹙2004﹚，「可靠度保證-工程與管理技術之應用」，中華民國品管學會，台北市。
4.柯煇耀﹙2012﹚，「壽命試驗與評估-加速試驗技術之應用」，科技圖書股份有限公司，台北市。
5.唐麗英、王春和﹙2013﹚，「從範例學Minitab統計分析與應用」，第二版，博碩文化股份有限公司，新北市。
6.桑慧敏﹙2007﹚，「機率與推論統計原理」麥格羅希爾國際股份有限公司，台北市。
7.桑慧敏、雷顯宇、曾勝滄﹙2004﹚，「樹脂式變壓器之壽命評估研究（I）」，行政院國家科學委員會專題研究計畫。
8.陳耀茂﹙2001﹚，「可靠度工程-方法與應用」，五南圖書出版公司，台北市。
9.陳哲鍇﹙2013﹚，「預估鋰電池模組循環壽命的加速壽命測試與壽命評估建模」，國立臺灣海洋大學碩士論文，基隆市。
10.張正忠﹙2003﹚，「產品加速壽命測試規劃之研究-以8205 無刷直流風扇為例」，國立高雄第一科技大學碩士論文，高雄市。
11.張凱程﹙2003﹚，「已知產品壽命之加速壽命測試模式之探討-以2瓦燈泡為例」，國立高雄第一科技大學碩士論文，高雄市。
12.黃國格﹙2005﹚，「加速壽命試驗於無線網路基地台平均壽命之研究」，華梵大學碩士論文，新北市。
13.童超塵﹙2005﹚，「Minitab壽命試驗統計分析」，國立雲林科技大學工業工程與管理所，雲林縣。
14.楊昌裔﹙2007﹚，「可靠度工程」，新文京開發出版股份有限公司，台北縣。
15.衛志鋼﹙2006﹚，「DOM產品可靠度試驗計劃」，華梵大學碩士論文，新北市。
16.Melissa A. Schilling ﹙2013﹚，李亭林譯，「科技創新管理」，第四版，麥格羅希爾國際股份有限公司，台北市。
英文部分
1.Feilat, E.A., Grzybowski, S., Knight, P.,﹙2002﹚,Accelerated aging of high voltage encapsulated transformers for electronics applications, Properties and Applications of Dielectric Materials,Vol.1, 209-212, 21-26.
2.IEC 62391-1,﹙2015﹚,Fixed electric double layer capacitors for use in electronic equipment, part 1: generic specification.
3.Jayatilleka, S., Okogbaa, G.,（2003）,Use of Accelerated Life Test on Transmission Belts for Predicting Product Life, Identifying Better Designs, Materials and Suppliers, Proceedings of Annual Reliability and Maintainability Symposium,Ottawa,Ontario, Canada, 101-105.
4.Kobayashi, Y.,﹙1992﹚, Acceleration coefficient of the molded electric double layer capacitor,Proceedings of the 42nd Electronic Components and Technology Conference,617-623.
5.Kleyner, A. , Boyle, J.,（2003）, Reliability prediction of substitute parts based on component temperature rating and limited accelerated test data,Proceedings of the Annual Reliability and Maintainability Symposium, Kokomo, IN, U.S.A., 518-522.
6.Markets and Markets,﹙2016﹚, Supercapacitor Market by Type (Double Layer, Pseudocapacitor,and Hybrid), Application (Laptop,Camera,Power Backup,Memory, UPS,Aircraft,Solid-State Disc Drives) Vertical, and Geography-Global Forecast to 2022 from the World Wide Web: http://www.marketsandmarkets.com/Market-Reports/supercapacitor-market-37140453.html
7.Nelson, W.,（1980）Accelerated life testing-step-stress models and data analyses, IEEE Transactions on Reliability, 29, 103-108.
8.Park, S. J., Ha, J. S., Choi, W. S. and Park, S. D.,﹙2002﹚, Improving the reliability of a newly-designed mobile phone by environmental tests and accelerated life Tests, Annual Reliability and Maintainability Symposium, Seattle, WA,U.S.A.,642-646.
9.Sidharth, Sundaram, S.,（2004）, A methodology to assess microprocessor fan reliability, Proceedings of The Nineth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems,Sunnyvale, CA, U.S.A.,96-101.
10.www.IDTechEx.com/EDLC,﹙2013﹚, Change of leadership of the global market value of supercapacitors? from the World Wide Web:
http://www.idtechex.com/research/articles/change-of-leadership-of-the-global-market-value-of-supercapacitors-00005344.asp
11.Kim, Y.T., Kim, K-B., Hyun, Y.E., Kim, I-J., Yang, S.,﹙2015﹚, Simulation study on the lifetime of electrochemical capacitors using the accelerated degradation test under temperature and voltage stresses, Microelectronics Reliability