對高度競爭的電子產業而言，製程後續的檢測不僅可以提高產品的良率，更能減少在不良品上加工的浪費。利用X射線電腦斷層掃瞄法（X-Ray Computer Tomography）進行影像重建，來判斷生產線上的製程缺陷，但因為在投影時間或者是運算速度上無法同時達到工業所要求的速度，本研究將利用類神經網路配合濾波逆投影法(FBP)來改善有限張數投影下重建影像品質不佳的問題。
另外本研究也使用修正型SART(ELSSART)來重建影像，重建三維空間的BGA錫球結構，並由所得到的影像與SART的重建結果做分析和比較。

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