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研究生: 曾致豪
Zhi-Hao Tseng
論文名稱: 覆晶式微型陀螺儀之製造及封裝
Fabrication and Package of Flip Chip Type Micro Gyroscope
指導教授: 曾繁根
Fan-Gang Tseng
口試委員:
學位類別: 碩士
Master
系所名稱: 原子科學院 - 工程與系統科學系
Department of Engineering and System Science
論文出版年: 2005
畢業學年度: 93
語文別: 中文
論文頁數: 95
中文關鍵詞: 電子構裝微型陀螺儀氣密凸塊深蝕刻微機電技術
外文關鍵詞: electronic package, micro gyroscope, hermetic, solder bump, DRIE, MEMS technology
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  • 在半導體及微機電技術中,封裝為所有元件走出實驗室皆須經過的一種程序。封裝在微機電領域來說,其方法大多取自於傳統的IC封裝方式,但多變化的微機電元件常常讓傳統的IC封裝方法不敷使用,並且也提升了微機電元件的成本消耗。
    本研究針對於本實驗室所發展之第三代微型陀螺儀,進行了本體結構製造,以及設計出可同時達成訊號導出以及氣密功能之覆晶型封裝結構,成功地完成其微型陀螺儀之封裝,並利用所設計的測試晶片平台,量測其訊號傳遞之覆晶焊錫凸塊阻抗約為1.8∼1.9Ω,其腔體約有2.4∼4.8×10-8 atm.cc/s之氦氣洩漏率。
    結果顯示本研究所提出的封裝結構能應用於多接點微元件之訊號傳輸及氣密封裝上,也可有效降低封裝元件之整體面積。


    In terms of the semiconductor and MEMS technology, package is the process that all the devices have to go through before being taking out of the laboratory. In the MEMS field, most of the ways of packaging are adopted from those of the traditional IC packaging, which, however, cannot satisfy the various needs of the modern MEMS devices and also increases the cost of the MEMS devices greatly.
    This thesis is mainly about the fabrication of the third generation micro gyroscope that our laboratory have developed, the successful design of the structure of the flip chip type packaging, which is able to both transmit electric signal and function the hermetic sealing. With the structure, the packaging of the micro gyroscope has been successfully completed. Furthermore, by using the test vehicle chip, the electric resistance, ranging from 1.8 to 1.9Ω, has been measured from the flip chip solder bump which transmits electric signals. The helium leak rate of the hermetic sealing chamber is 2.4 to 4.8×10-8 atm.cc/s.
    The result of the research shows that the innovative design of the structure of the flip chip type package demonstrated in the thesis can be applied in the signal transmission and the hermetic package of the multiple I.O. micro device. Moreover, the design can effectively minify the size of the packaging devices as well.

    目錄 頁次 摘要 I ABSTRACT II 誌謝 III 目錄 IV 圖目錄 VII 表目錄 XI 第一章 序論 1 1.1 前言 1 1.2 陀螺儀之相關原理 5 1.3 微型陀螺儀元件 11 1.3.1 元件介紹 11 1.3.2 微型陀螺儀之製程 14 第二章 氣密封裝技術介紹及文獻回顧 18 2.1 氣密特性 18 2.2 接合技術 19 2.3 接合技術分類 21 2.4 氣密封裝類型 35 2.5 封裝應用例 38 第三章 感測器元件封裝 44 3.1 封裝結構構想 44 3.2 封裝晶片製程 46 3.3 厚膜光阻製程 50 3.4 錫鉛電鍍製程 53 3.5 測試晶片平台設計 55 3.5.1 凸塊電阻量測原理 56 3.5.2 氣密性量測原理 59 第四章 實驗結果與討論 63 4.1 覆晶凸塊 63 4.1.1 厚膜光阻 64 4.1.2 錫鉛及銅電鍍製程 64 4.1.3 錫鉛成分及均勻性分析 65 4.1.4 錫鉛回銲製程 67 4.2 測試晶片 73 4.2.1 焊錫均勻度 73 4.2.2 測試晶片之凸塊電阻量測結果 78 4.2.3 測試晶片之氣密性量測結果 81 4.3 微型陀螺儀元件 83 4.3.1 微型陀螺儀元件製程 83 4.3.2 黃光製程結果 83 4.3.3 深反應性離子蝕刻(DRIE)蝕刻製程結果 85 4.3.4 BOE蝕刻製程 87 4.4 封裝之感測器元件驅動測試 89 第五章 結論與未來展望 91 5.1研究成果探討 91 5.2 未來展望 92 參考文獻 94

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