研究生: |
曾致豪 Zhi-Hao Tseng |
---|---|
論文名稱: |
覆晶式微型陀螺儀之製造及封裝 Fabrication and Package of Flip Chip Type Micro Gyroscope |
指導教授: |
曾繁根
Fan-Gang Tseng |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
原子科學院 - 工程與系統科學系 Department of Engineering and System Science |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 中文 |
論文頁數: | 95 |
中文關鍵詞: | 電子構裝 、微型陀螺儀 、氣密 、凸塊 、深蝕刻 、微機電技術 |
外文關鍵詞: | electronic package, micro gyroscope, hermetic, solder bump, DRIE, MEMS technology |
相關次數: | 點閱:2 下載:0 |
分享至: |
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
在半導體及微機電技術中,封裝為所有元件走出實驗室皆須經過的一種程序。封裝在微機電領域來說,其方法大多取自於傳統的IC封裝方式,但多變化的微機電元件常常讓傳統的IC封裝方法不敷使用,並且也提升了微機電元件的成本消耗。
本研究針對於本實驗室所發展之第三代微型陀螺儀,進行了本體結構製造,以及設計出可同時達成訊號導出以及氣密功能之覆晶型封裝結構,成功地完成其微型陀螺儀之封裝,並利用所設計的測試晶片平台,量測其訊號傳遞之覆晶焊錫凸塊阻抗約為1.8∼1.9Ω,其腔體約有2.4∼4.8×10-8 atm.cc/s之氦氣洩漏率。
結果顯示本研究所提出的封裝結構能應用於多接點微元件之訊號傳輸及氣密封裝上,也可有效降低封裝元件之整體面積。
In terms of the semiconductor and MEMS technology, package is the process that all the devices have to go through before being taking out of the laboratory. In the MEMS field, most of the ways of packaging are adopted from those of the traditional IC packaging, which, however, cannot satisfy the various needs of the modern MEMS devices and also increases the cost of the MEMS devices greatly.
This thesis is mainly about the fabrication of the third generation micro gyroscope that our laboratory have developed, the successful design of the structure of the flip chip type packaging, which is able to both transmit electric signal and function the hermetic sealing. With the structure, the packaging of the micro gyroscope has been successfully completed. Furthermore, by using the test vehicle chip, the electric resistance, ranging from 1.8 to 1.9Ω, has been measured from the flip chip solder bump which transmits electric signals. The helium leak rate of the hermetic sealing chamber is 2.4 to 4.8×10-8 atm.cc/s.
The result of the research shows that the innovative design of the structure of the flip chip type package demonstrated in the thesis can be applied in the signal transmission and the hermetic package of the multiple I.O. micro device. Moreover, the design can effectively minify the size of the packaging devices as well.
參考文獻
1.劉得彰,“科學月刊”,0201期, 1986年9月.
2. Nadim Maluf, “An Introduction to Microelectromechanical Systems Engineering”, Artech House Publishers, 2000.
3. Dr. B Johnson, ”Vibrating gyroscopes”, IEE, 1994.
4.蔡炯彣, “微型陀螺儀之模擬與研製”, 國立清華大學工程與系統科學研究所碩士論文, 2004.
5. Seong-A Kim, Young H. Seo, Young-Ho Cho, Geun Ho Kim, Jae Y. Park, Jong U. Bu, “Closed Loop Solder-Line on Heated Substrates”, Electronic Components and Technology Conference, 2002, p. 1101-1105.
6. Byeungleul Lee, Seonho Seok, Kukjin Chun, “A study on wafer level vacuum packaging for MEMS device”, J. Micromech. Microeng., Vol. 13, 2003, p. 663-669.
7. Timothy J. Harpster, Khalil Najafi, “Long-Term Testing of Hermetic Anodically Bonded Glass-Silicon Packages”, IEEE Conference, 2002, p. 423-426.
8. D. Stroehle, “On the penetration of water vapor into packages with cavities and on maximum allowable leak rates”, 15th Annual Proceedings, Reliability Physics Symposium, 1977, p. 101-106.
9. Tai-Ran Hsu, “MEMS Packages”, ISBN 0-86341-335-8, 2004.
10. 劉俊賢, 徐嘉彬, “晶圓鍵合製程及設備介紹”, 光電與半導體設備與技術專輯, 246期, p.179.
11. W. H. Ko, J. T. Suminto, G. J. Yeh, Micromachining and Micropackaging of Teansducers, 1985, p. 41-61.
12. Colin A. Mackay, S. W. Levine, “Solder Sealing Semiconductor Packages”, IEEE Transactions on Components Hybrids and Manufacturing technology, Vol. Chmt-9, No.2, 1986, p. 195-201.
13. Woonbae Kim, Qian Wang, et al, “Application of Au-Sn Eutectic Bonding in Hermetic RF MEMS Wafer Level Package”, 9th Int’l Symposium on Advanced Package Materials, IEEE 2004, p. 215-219.
14. M. Rassaian, M. W. Beranek, “Hermeticity Lifetime of a 63Sn37Pb Solder Sealed Optical Fiber Feedthrough”, IEEE, 1995, p. 1110-1115.
15. Brian H. Stark, Khalil Najafi, “A low-temperature thin-film electroplated metal vacuum package”, J. Microelectromechanical Systems, Vol. 13, No.2, 2004, p. 147-157.
16. M. Ohring, “Reliability and Failure of Electronic Materials and Device”, Academic Press Limited, 1998, Chapter 8
17. L. Lin, “Selective encapsulations of MEMS: Micro channels, needles, resonators, and electromechanical filters”, Ph.D. dissertation, Dept. Mech. Eng., Univ. California at Berkeley, Berkeley, CA, 1993.
18. Liwei Lin, “MEMS Post-Package by Localized Heating and Bonding”, IEEE Transactions on Advanced Package, Vol. 23, No. 4, 2000, p. 608-616.
19. Y. T. Cheng, Liwei Lin, Khalil Najafi, “Localized Silicon Fusion and Eutectic Bonding for MEMS Fabrication and Packaging”, Journal of Microelectromechanical System, Vol. 9, No. 1, 2000, p. 3-8.
20. M. M. Farooqui, A. G. R. Evans, “A polysilicon-diaphragm-based pressure sensor technology”, J. Phys. E: Sci., 20, 1987, p.1469-1471.
21. Liwei Lin, Roger T Howe, Albert P. Pisano, “Microelectromechanical Filters for Signal Processing“, J. of Microelectromechanical System, Vol 7, No.3, 1998, P. 286-294
22. Mu Chiao, Liwei Lin, “Hermetic wafer bonding based on rapid thermal processing”, Sensors and Actuaators, 2001, p. 398-402.
23. http://www.amt.com.tw/ 台灣應用材料, 半導體製程介紹.
24. 王致誠, 曾志遠, ”金凸塊設備製程與技術探討”, 機械工業雜誌, 258期, p.178-180.
25.精儀中心,”真空技術與應用”, p.314.
26.Hirokazu Ezawa, Masahiro Miyata, Soichi Honma, “Eutectic Sn-Ag solder bump process for VLSI flip chip technology”, Electronic Components and Technology Conference, 2000, p.1098.
27.John H. Lau, “Flip chip technologies “, chapter 2,1995.
28.Low level measurements handbook 6th edition,Keithley.
29.Depatment of defense, “Test method standard microcircuit”, USA, 1996.