批間控制(run-to-run control，RtR control)現今已被廣泛使用於半導體產業，來降低製程的誤差，以達到最佳控制結果。大部分有關於批間控制方面的研究，都是針對單一機台上的單一種產品而言；然而在實際的工廠操作下，都是在單一機台上運行多種不同的產品。本篇論文將這種「少量多樣」的製程，稱為high-mix製程。本篇論文對上述產品生產情形，歸納出兩種不同的控制策略：
1.每一批次生產的不同產品，可以經由EWMA(Exponent Weight Moving Average)控制器估算出製程干擾。此種控制方法，稱為「以機台為基礎的控制」（tool-based control）。
2.分別考慮同一機台的不同產品，不同的產品有個別的控制器控制。此種控制方法，稱為「以產品為基礎的控制」（product-based control）

本篇論文主要利用單一機台上兩個個別的產品製程，對兩種不同的控制策略進行數學上的理論推導及模擬控制結果。由最終的控制結果顯示，倘若使用tool-based control，在機台有非穩態(non-stationary)干擾及製程和產品模式彼此不協調時，其控制結果會發散。而使用product-based control，其控制結果不會發散，但是當機台有相當顯著的飄移時，控制結果較單一產品的控制為差。

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