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研究生: 洪笙益
Hung, Sheng-Yi
論文名稱: 在多重限制下高效能的系統封裝分割
High Performance System-In-Package Partitioning With Multiple Constraints
指導教授: 麥偉基
Mak, Wai-Kei
口試委員:
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 資訊工程學系
Computer Science
論文出版年: 2009
畢業學年度: 97
語文別: 英文
論文頁數: 34
中文關鍵詞: 系統封裝分割
外文關鍵詞: System-In-Package Partitioning
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  • 在這篇論文中,我們建議了兩種對於系統封裝(System-In-Package)
    分割的方法,首先,我們建議了整數線性規畫(Integer Linear
    Programming)的方法來解決此系統封裝分割的問題.接下來,我們也
    建議了模擬退火(Simulated Annealing)的方法來解決系統封裝分割
    的問題.我們的系統封裝分割的目標是最小化,不同層的總線長長度
    (total length of inter-layer connections),消耗總墊子數(I/O
    Pads),溫度(temperature),與平面的連線總長度(on-chip
    wire-length).實驗結果顯示,我們模擬退火方法改進,不同層的總
    線長長度0.31%~7.72%,消耗總墊子數0.34%~3.31%,溫度
    0.83%~11.74%與平面的連線總長度0.05%~2.8%在與hmetis 比較的結
    果之下.


    In this thesis, we have presented two partitioning approaches for a die-stacking SiP design.
    First, we use Integer Linear Programming (ILP) based method to solve this problem.
    Second, we use Simulated Annealing (SA) based method to solve this problem. Our SiP
    partitioning goal is to minimize total length of inter-layer connections, total I/O pads, onchip
    wire-length and temperature in order to get better performance. The experimental
    results on the Gigascale Systems Research Center (GSRC) benchmarks show that our SA
    based method improves the total length of inter-layer connections by 0.31%-7.72%, total
    I/O pads by 0.34% - 3.13%, temperature by 0.83% - 11.74% and on-chip wire-length by
    0.05% - 2.8% compared with hmetis [10].

    Contents Acknowledgement i Abstract ii 1 Introduction 1.1 Related background of System-In Package 1.2 Motivation 1.3 Our contribution 1.4 Organization 2 Preliminaries 2.1 Thermal Model 3 Problem Definition 3.1 Input information and our goal 3.2 Assumptions and a Terminology Definition 4 Algorithm 4.1 Integer Linear Programming (ILP) Method 4.1.1 Evaluate Bonding Wire-length 4.1.2 Evaluate Number of I/O Pads 4.1.3 Evaluate the Temperature of SiP 4.1.4 Final ILP for SiP Partitioning 4.2 Simulated Annealing (SA) Based Partitioning 4.2.1 Set of Moves 4.2.2 Cost Function 5 Experimental Result 6 Conclusion

    [1] Sungjun Im and Kaustav Banerjee, “Full Chip Thermal Analysis of Planar (2-D) and Vertically Integrated (3-D) High Performance ICs,” in Proc. International Electron Devices Meeting, pp.727-730, 2000.
    [2] P. Wilkerson, A. Raman, and M. Turowski, “Fast, automated thermal simulation of three-dimensional integrated circuits,” Thermal and Thermomechanical Phenomena in Electronic Systems, pp.706- 713, 2004.
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    [7] M. Stan, K. Skadron, M. Barcella, W. Huang, K.Sankaranarayanan, and S. Velusamy,
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    IEEE Transactions on Very Large Scale Integration Systems, pp.501- 513, 2006.
    [8] Jason Cong, Jie Wei, and Yan Zhang, “A Thermal-Driven Floorplanning Algorithm for 3D ICs,” IEEE/ACM International Conference on Computer Aided Design, pp.306-313, 2004.
    [9] Tiao Zhou and Mark Gerber, “Stacked Die Package Guidelines,” Amkor Tchnology,Inc., white paper, 2004.
    [10] http://glaros.dtc.umn.edu/gkhome/
    [11] http://www.necel.com
    [12] http://en.wikipedia.org/wiki/

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