研究生: |
賴志男 Zen-Nan Lai |
---|---|
論文名稱: |
用於邏輯晶片的萬用多個廣播掃描測試技術 Universal Multi-Casting Scan for Logic IC's |
指導教授: |
黃錫瑜
Prof. Shi-Yu Huang |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 產業研發碩士積體電路設計專班 Industrial Technology R&D Master Program on IC Design |
論文出版年: | 2007 |
畢業學年度: | 95 |
語文別: | 英文 |
論文頁數: | 34 |
中文關鍵詞: | 廣播掃描測試 |
外文關鍵詞: | Universal Multi-Casting Scan |
相關次數: | 點閱:2 下載:0 |
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這個論文中,我們提出一個萬用型的多個廣播掃瞄測試架構來進行測試資料與測試時間的壓縮。只要一些少許硬體的支援,這個系統可以進行萬用型的多個廣播測試–也就是一些掃瞄鏈,只要它們是相容的,就可以透過我們的硬體架構達到共享一組測試向量的目的。這個方法需要將一些額外的控制資訊填到被壓縮的測試資料裡。但是,透過一些像『控制模式編碼和跳躍』,和『部分測試向量回收使用』等技術,我們將證明這些額外的控制資訊可以被降到最低的水準。我們的方法可以達到比以前多個廣播為基礎的方法更高的測試壓縮比率。
We present a Universal Multicasting Scan (UMC-Scan) architecture for test compression. With some hardware support, this scheme allows universal multicasting by which we mean that one is able to shift in a test pattern to arbitrary set of scan chains as long as they are compatible. It does require the addition of some extra control bits padded to the compressed test pattern. However, by incorporating techniques such as control pattern encoding, skipping, and partial data reuse, we will demonstrate that the control overhead can be reduced to a modest level. For the first time, we reported experimental results approaching the maximum test compression ratio allowed by the popular multicasting methodology.
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