研究生: |
梁志彰 Chih-Chang Liang |
---|---|
論文名稱: |
應用FDK重建法於BGA檢測之研究 The Study of Using FDK Reconstruction Technique on BGA Inspection |
指導教授: |
林士傑
Shin-Chieh Lin |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 動力機械工程學系 Department of Power Mechanical Engineering |
論文出版年: | 2008 |
畢業學年度: | 96 |
語文別: | 中文 |
論文頁數: | 95 |
中文關鍵詞: | X射線電腦斷層掃描法 、FDK演算法 、BGA檢測 |
外文關鍵詞: | X-Ray Computer Tomography, FDK Algorithm, BGA Inspection |
相關次數: | 點閱:1 下載:0 |
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由於當今的電子組裝技術趨向高密度化及微小化。在傳統上以人眼檢測電子產品瑕疵已不敷使用。目前廣泛採用二維的自動光學檢測(Automatic Optical Inspection)設備,但只能做零件表面的檢測工作,對於很多內部缺陷卻無從解決。因此本研究冀望以X射線電腦斷層掃瞄法(X-Ray Computer Tomography)來進行物件三維結構的影像重建,最後以所得到的立體影像來判斷生產線上的各類製程缺陷。
鑒於檢測效率是工業界所強調的重點。採用了重建速度快的FDK (Feldkamp-Davis-Kress,1984 )重建法,配合簡單的圓形投影軌跡去重建本研究所欲檢測的BGA錫球樣本,並進行FDK重建法的參數討論,最後藉由重建後的影像結果分析缺陷是否存在。
參考文獻
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