研究生: |
張容榕 Jung-Jung Chang |
---|---|
論文名稱: |
液晶顯示器缺陷檢測訓練專家系統之發展 The Development of a Training Expert System for TFT-LCD Defects Inspection |
指導教授: |
黃雪玲
Sheue-Ling Hwang |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 工業工程與工程管理學系 Department of Industrial Engineering and Engineering Management |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 英文 |
論文頁數: | 74 |
中文關鍵詞: | 薄膜電晶體液晶顯示器 、不均勻缺陷 、人眼視覺檢測 、專家系統 |
外文關鍵詞: | TFT-LCD, Mura defects, Human visual inspection, Expert System |
相關次數: | 點閱:3 下載:0 |
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近年來,隨著薄膜電晶體液晶顯示器(TFT-LCD)的演進與發展,全球對於液晶顯示器的需求快速成長。在2004年,台灣的液晶顯示器製造產業已經成為全球市場占有率的第二位。液晶面板的製造過程中,容易產生許多不同種類的缺陷,進而影響面板的品質。源於日本的Mura是指液晶面板上可見的不均勻現象。目前液晶顯示器製造商皆採用人眼視覺檢測的方法來評估面板的品質,其中最主要的檢驗工作就是檢查面板的缺陷現象。由於缺陷種類眾多且難以辨識,檢測員必須於訓練時熟記各項不良現象的檢驗文件,其中包括輔助檢查畫面、不良項目的特徵與等級規格等。對於檢測員而言,液晶面板的檢驗流程實為相當複雜的程序,因而造成檢測員工作負荷的增加。
本研究著重於改善現有的面板檢驗流程,以減少檢測員的工作負荷。首先透過問卷調查的方法來收集檢驗資料,接著透過與有經驗的檢測員訪談,以擷取知識,並運用二維矩陣及群組技術的方法,發現檢查畫面與面板缺陷之間的關聯規則。應用基本的關聯規則,針對輔助檢查畫面的配置進行分析與研究,進而提出重新配置的檢查畫面順序,期望能使檢查工作更有效率。此外,本研究的目的是根據分析出的關聯規則與檢查策略,建構面板檢測之專家系統。此專家系統可視為訓練支援系統,由新手實驗以及專家評估的結果得知,此電腦輔助訓練系統能輔助受訓之檢測員更有效地學習檢測技能,更期能夠提升檢測的訓練績效,進而達到降低檢測成本之成效。
In recent years, the demand of thin-film transistor liquid crystal display (TFT-LCD) increases rapidly. Taiwan became the second major country in 2004 with the expanded global market for LCD industrial. In general, the mura defect which is a Japanese term meaning imperfective blemish may occur during LCD panels manufacturing process. At present, the image quality of LCD panels has been determined subjectively by means of human visual inspection. In fact, the inspectors need to remember a large number of instructions because mura defects are usually difficult to detect. The inspection tasks include a series of complicated procedures that increase the workload for the inspectors.
This research focuses on the improvement of LCD inspection process in order to reduce the inspectors’ workload. The inspection information was gathered through questionnaire survey at first. Then the knowledge extracting was to analyze association rules through interviewing experienced inspectors. The nested IF-THEN inspection rules between test patterns were analyzed by means of two-dimensional matrix and group technology (GT). In terms of inspection test patterns, the occurring sequence of pattern was rearranged in order to make inspection tasks more efficiently. Furthermore, this study aimed to construct an expert system for inspecting LCD defects according to inspection rules and strategies. According to the results of the experiment and expert evaluation, the expert system was proposed as a training support system to aid the trainees to learn inspective skills more effectively. Therefore, the performance of the inspection training could be increased. The cost of manufacture could be also reduced significantly.
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