相位訊息對顯微鏡學一直是非常重要的，不論是在光學或電子光學的領域中，許多學者一直都在尋求方法來獲得相位訊息。而相位對於生物學家來說也是非常重要，如光學顯微鏡中最著名的Zernike相位板，它可以令原本對比不佳的生物試片不需經由染色，也可以利用相位對比來提升試片的清晰度。
在電子顯微鏡中雖然也有一群人利用了Zernike相位板的概念，想要在電子顯微鏡中得到相位訊息，雖然在生物試片上有初步的成果，但是對於材料方面的使用還是有問題的。這時候電子全像術就是另一個較佳的選擇，因此有許多顯微鏡學家紛紛投入電子全像術的研究，使得這一技術也已經漸趨成熟。但電子全像術畢竟所費不貲，且試片製備不易等種種的缺點，最後才會有人再提出一堆非干涉式成像法的理論來進行相位回復的研究。
電子全像術最令人滿意的並不僅僅在於相位影像的取得，而是相位影像中的相位變化量的可信度極高，這一部份就是目前非干涉式成像法所要追求的最終目的，因此在本論文中所訴求的就是相位定量的部分。另一方面到目前為止在非干涉式成像法的實驗中，實驗的對象都侷限在材料試片上，而僅在電子全像術有帶電探針靜電場量測的實驗。有鑑於此，我們在本研究中也試著將帶電探針靜電場當做實驗對象，並得到不錯的定性結果，而定量部分也與模擬的結果差不多；而且我們更進一步的將這個方法應用到氧化銦奈米線，也一樣得到還不錯的結果。
因此透過本實驗的研究，相信這個方法往後可以應用不僅在靜電場量測方面，甚至於加以改良後，可以應用於奈米線的場發射效應觀察。

參考文獻

[1] J. C. H. Spence , ‘Experimental High-Resolution Electron Microscopy’
[2] M. F. C. Ladd and R. A. Palmer : ‘Theory and practice of direct methods in crystallography(1980)’
[3] Woolfson, M. M. : ’.Direct methods in crystallograph(1980)’
[4] CATICHA A, CATICHAELLIS S, PHYSICAL REVIEW B 25 (2) (1982) 971-983
[5] CATICHA A, CATICHAELLIS S, AIP CONFERENCE PROCEEDINGS
[6] J.J. Sakurai ; San Fu Tuan : ‘Modern quantum mechanics(1985)’
[7] Y. Aharonov, D. Bohm, Phys. Rev. , 115 (1959) 485
[8] A. Orchowski, W. D. Rau, H. Lichte, Phys. Rev. Lett. 74 (1995) 399
[9] D. Van Dyck, H. Lichte, K. D. van der Mast, Ultramicroscopy 64 (1996) 1
[10] R.Danev, K.Nagayama, Ultramicroscopy 88(2001) 243
[11] T.Matsumoto, A.Tonomura, Ultramicroscopy 63(1996) 5
[12] E. J. Kirkland, B. M. Siegel, N. Uyeda and Y. Fujiyoshi, Ultramicroscopy 17 (1985) 87
[13] H. Lichte and B. Freitag , Ultramicroscopy 81 (3-4) (2000) 177
[14] David B. Williams, C. Barry Carter : ‘Transmission electron microscopy’
[15] J. M. Cowley, J. C. H. Spence, ‘Introduction to Electron Holography’ 17-56
[16] D. Paganin and K. A. Nugent, Phys. Rev. Lett. 80 (1998) 2586
[17] A. Orchowski, W. D. Rau, H. Lichte, Phys. Rev. Lett. 74 (1995) 399
[18] P. Schiske, in: P. Hawkes (Ed.), Image Processing and Computer-Aided Design in Electron Optics, 1973
[19] W. O. Saxton, in: Advances in Electronics and Electron Physics, Computer Techniques for Image Processing in Electron Microcopy (Academic Press, New York, 1978)
[20] W. O. Saxton, Microsc. Spectrosc. Electron. 5 (1980) 665
[21] E. J. Kirkland, Ultramicroscopy 15 (1984) 151
[22] E. J. Kirkland, B. M. Siegel, N. Uyeda and Y. Fujiyoshi, Ultramicroscopy 17 (1985) 87
[23] D. Van Dyck, and M. Op De Beeck, in: Proc. 12th Int. Congr. for Electron Microscopy, Scattle (1990) p.26
[24] A. I. Kirland, W. O. Saxton, K. L. Chau, K. Tsuno and M. Kawasaki, Ultramicroscopy 57 (1995) 355
[25] L. J. Allen, H. M. L. Faulkner, M. P. Oxley, D. Paganin, Ultramicroscopy 88 (2001) 85
[26] L. J. Allen, M. P. Oxley, Optics Communication 15(2001)65
[27] L. J. Allen, W. McBride, M. P. Oxley, Optics Communication 233(2004)77-82
[28] Wen-Kuo Hsieh, Fu-Rong Chena, Ji-Jung Kaia, A.I. Kirkland,
Ultramicroscopy 98 (2004) 99–114
[29] D. Paganin and K. A. Nugent, Phys. Rev. Lett. 80 (1998) 2586
[30] T. E. Gureyev, A. Roberts, and K. A. Nugent, J. Opt. Soc. Am. A 12 (1995) 1942
[31] T. E. Gureyev, A. Roberts, and K. A. Nugent, J. Opt. Soc. Am. A 13 (1996) 1670
[32] T. E. Gureyev, and K. A. Nugent, Opt. Commun.133 (1997) 339
[33] K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 77 (1996) 2961
[34] T. E. Gureyev, C. Raven, A. Snigirev, I. Snigirev, and S. W. Wilkins, J. Phys. D 32 (1999) 563
[35] Brendan E. Allman, Philips J. McMahon, Justine B. Tiller, Keith A. Nugent, David Paganin, Anton Barty, J. Opt. Soc. Am. 14 (2000) 1732
[36] S. Bajt, A. Barty, K. A. Nugent, M. McCarteny, M. Wall, and D. Paganin, Ultramicroscopy, 83 (2000) 67
[37] Y. M. Zhu, V. V. Volkov, M. De Graef, J. Electron Microscopy, 50 (2001) 447
[38] M. De Graef, Y. M. Zhu, J. Appl. Phys. 89 (2001) 7177
[39] L. J. Allen, H. M. L. Faulkner, M. P. Oxley, D. Paganin, Ultramicroscopy 88 (2001) 85
[40] B. E, Allman, P. J. McMahon, K. A. Nugent, D. Paganin, D. L. Jacobson, M. Arif, and S. A. Werner, Nature 408 (2000) 158
[41] M. R. Teague. J. Opt. Soc. Am. 73 (1983) 1434
[42] D. Paganin and K. A. Nugent, Phys. Rev. Lett. 80 (1998) 2586
[43] NanoFactory Instruments, http://www.nanofactory.com/
[44] H. Ohnishi, Y. Kondo, and K. Takayanagi, Nature 395 (1998) 780
[45] J. Cumings, A. Zettl, M. R. McCartney, and J.C.H. Spence, Phys. Rev. Lett. 88 (2002) 056804(1-4)
[46] Lo, W.K. and J.C.H. Spence, Ultramicroscopy 48 (1993) 433.
[47] T. Kizuka, Phys. Rev. Lett. 81 (1998) 4448.
[48] Gatan, http://www.gatan.com/
[49] Meyer RR, Kirkland AI and Saxton WO, Electron Microscopy and Analysis (168)23-26 2001
[50] G. matteucci, G.F. Missiroli and M. Muccini, Ultramicroscopy 45 (1992) 77-83
[51] E. Durand, Electrostatique, Vol 2(Masson, Paris, 1966) p.173
[52] Edgar Völkl, Lawrence F. Allard and David C. Joy, Introduction to Electron Holography, 1998, p. 278
[53] R.W. Gerchberg and W.O. Saxton,,Optik,35(2)237-246 1972