研究生: |
林容丞 Lin, Jung Cheng |
---|---|
論文名稱: |
微波材料處理與材料特性量測 Microwave Materials Processing and Property Measurement |
指導教授: |
張存續
Chang Tsun Hsu |
口試委員: |
朱國瑞
Chu, Kwo Ray 金重勳 Chin, Tsung Shune 張士欽 Chang, Shih Chin |
學位類別: |
碩士 Master |
系所名稱: |
理學院 - 物理學系 Department of Physics |
論文出版年: | 2012 |
畢業學年度: | 100 |
語文別: | 中文 |
論文頁數: | 69 |
中文關鍵詞: | 微波材料處理 、材料特性量測 |
外文關鍵詞: | microwave materials processing, microwave materials property measurement |
相關次數: | 點閱:3 下載:0 |
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由於近年研究發現微波加熱較傳統加熱有優勢,而材料的特性是決定微波加熱情況的關鍵,所以本論文我們建構了一個可以進行材料處理,以及量測材料特性的實驗系統,最高可以將SiC加熱到670℃。但因為常溫的材料特性是熟知的,而材料特性隨溫度的變化則不清楚,所以我們用了兩種腔體微擾法來量測材料SiC在不同溫度時的介電常數。用傳統的腔體微擾法量測,其優點是使用上較為方便,但缺點是適用性不廣泛,其要求材料的體積要遠小於腔體的體積,並且空腔的電場分布要相近於腔體內有材料的情況。所以我們提出另一個腔體微擾法,其適用的較為廣泛,沒有傳統的腔體微擾法的缺點,所以可以得到比較準確的數值。我們也做了實驗,運用兩種理論計算出不同溫度的SiC的介電常數,並進行比較,發現介電常數的實部結果差不多,但是介電常數的虛部則有顯著的差異,我們提出的方法有校正的效果。
[1] Bratislav Milovanovic, Sladjana Ivkovic, Visa Tasic, “A simple method for permittivity measurement using microwave resonant cavity”, Microwaves and Radar, 1998. MIKON '98., 12th International Conference, vol.3, pp. 705 - 709 ,May 1998
[2] Standard Test Method D-2520-81, “Complex permittivity of solid electrical insulating materials at microwave frequencies and temperatures to 1650C,” Amer. Soc for Testing and Materials, Philadelphia. PA
[3] Andrzej W. Kraszewski, Stuart O. Nelson, “Observation on Resonant Cavity Perturbation by Dielectric Objects,” IEEE Trans. Microwave Theory Tech., vol. 40, (1), pp. 151-155, Jan. 1992.
[4] Gholamreza Moradi, Ayaz Ghorbani, “Accurate Measurement of Dielectric Porperties of Materials,” IEEE Int. Conf. Microwave and Millimeter Wave Technology Proceedings, pp.130-133, 2002.
[5] Binshen Meng, John Booske, and Reid Cooper, “Extended Cavity Perturbation Technique to Determine the Complex Permittivity of Dielectric Materials,” IEEE Trans. Microwave Theory Tech., vol.43, pp.2633-2635, 1995.
[6] A. M. Nicolson, and G. F. Ross, “Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques,” IEEE Trans. Instrum. Meas., vol. IM-19, pp.377-382, Nov. 1970.
[7] Kamal Sarabandi, and Fawwaz T. Ulaby, “Technique for Measuring the Dielectric Constant of Thin Materials,” IEEE Trans. Instrum. Meas., vol. 37, pp. 631-636, Dec. 1988.
[8] Deepak K. Ghodgaonkar, Vasundara V. Varadan, and Vijay K. Varadan, “A Free-Space Method for Measurement of Dielectric Constants and Loss Tangents at Microwave Frequencies,” IEEE Trans. Instrum. Meas., vol. 37, pp. 789-793, Dec. 1989.
[9] D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, “Free-Space Measurement of Complex Permittivity and Complex Permeability of Magnetic Materials at Microwave Frequencies,” IEEE Trans. Instrum. Meas., vol. 39, pp. 387-394, Apr. 1990.
[10] James Baker-Jarvis, Eric J. Vanzura, and William A. Kissick, “Improved Technique for Determining Complex Permittivity with Transmission/Reflection Method,” IEEE Trans. Microwave Theory Tech, vol. MTT-38, pp.1096-1103, Aug. 1990.
[11] H. Huang, C. E. Free, K. E. G. Pitt, A. R. Berzins, and G. P. Shorthouse, “Relative Permittivity Measurement of Thick-Film Dielectrics at Microwave Frequencies,” Electronics Letters, vol.31, pp.1812-1814, Oct, 1995.
[12] Richard D. Holling, K. A. Jose, Anilkumar Tellakula, V. V. Varadan, and V. K. Varadan, “Microwave Characterization of Dielectric Materials from 8 to 110 GHz Using A Free-Space Setup,” Microwave and Optical Tech. Letters, vol.26, pp.100-105, July, 2000.
[13] S. Biju Kumar, U. Raveendranath, P. Mohanan, K. T. Mathew, M. Hajian, and L. P. Ligthart, “A Simple Free-Space Method for Measuring the Complex Permittivity of Single and Compound Dielectric Materials,” Microwave and Optical Tech. Letters, vol.26, pp.117-119, July, 2000.
[14] Tsenchieh Chiu, “Dielectric Constant Measurement Technique for a Dielectric Strip Using a Rectangular Waveguide,” IEEE Trans. Instrum. Meas., vol. 52, pp. 1501-1508, Oct. 2003.
[15] N. Gagnon, J. Shaker, L. Roy, A. Petosa, and P. Berini, “Low-Cost Free-Space Measurement of Dielectric Constant at Ka Band ,” IEE Proc.-Microw. Antennas Propag., vol.151, pp.271-276, June, 2004.
[16] Devendra Misra, “On the Measurement of the Complex Permittivity of Materials by an Open-Ended Coaxial Probe.” IEEE Microw. And Guided Wave Letters, vol.5, May, 1995.
[17] Ahmet Baysar, and James L. Kuester, “Dielectric Property Measurements of Materials Using the Cavity Technique,” IEEE Trans. Microwave Theory Tech., vol. MTT-40, pp.2108-2110, 1992.
[18] M. Sucher, “Dielectric Constants,” in Handbook of Microwave Measurements, M. Sucher and J. Fox, Eds., 3nd ed., vol.2, Brooklyn, N.Y.: Polytechnic Press, Chap. 9, 1963.
[19] R. F. Harrington, Time-Harmonic Electromagnetic Fields. New York: McGraw-Hill, 1961.
[20] Authur Von Hippel, Dielectric Materials and Applications. Authur Von Hippel Eds., New York: The Technology Press of M.I.T. and John Willey & Son.
[21] Edward L. Ginzton, Microwave Measurements.
[22] HFSS User’s Guide – High Frequency Structure Simulator, Electronic Design Automation Software.
[23] William D. Callister, Jr., Materials Science And Engineering An Introduction. New York: John Willey & Son.
[24] R. E. Collin, Foundations for Microwave Engineering. 2nd ed., McGraw-Hill.
[25] D. M. Pozar, Microwave Engineering. 2nd ed., John Willey & Son.
[26] J. D. Jackson, Classical Electrodynamics. 3nd ed., John Willey & Son.
[27] T. H. Chang, “微波物理與應用”講義, 清大物理系.
[28] Edward L. Ginzton, Microwave Measurements, New York: McGraw-Hill, 1975
[29] 林博文,“碳化矽及其他碳化物," 陶瓷技術手冊, 中華民國產業科技發展協進會, 761 (1994).
[30] E.Jansen, R.Ziermann, E.Obermeier, G..Krötz, Ch.Wagner, ”Measurement of the Thermal Conductivity of Thin β-SiC Films between 80 K and 600 K,”Materials Science Forum Vols. 264-268 pp 631-634,1998
[31] 盧佳卉,"高頻材料介電常數量測,"國立清華大學碩士論文,2005
[32] 徐複樺,"電磁場可控式之微波材料處理,"國立清華大學碩士論文,2009
[33] T. H. Chang, H. W. Chao, F. H. Syu, W. Y. Chiang, S. C. Fong, and T. S. Chin ,” Efficient heating with a controlled microwave field,”
Rev. Sci. Instrum. 82, 124703 (2011)