研究生: |
張柏賢 Po-Hsien Chang |
---|---|
論文名稱: |
新的時序錯誤偵測之合成系統 Synthesis of a Novel Timing Error Detection Architecture |
指導教授: |
張世杰
Shih-Chieh Chang |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 資訊工程學系 Computer Science |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 英文 |
論文頁數: | 36 |
中文關鍵詞: | 延遲 、變動 、時序錯誤 |
外文關鍵詞: | delay, varition, timing error |
相關次數: | 點閱:52 下載:0 |
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延遲變動可能會造成電路沒有辦法符合它的時序要求。Razor[5,12]這個研究觀察到電路裡的最壞情況很難會發生。他們提出了一個機制能夠偵測並更正那些不常發生的錯誤,因此電路可以對一般的情況最佳化。他們的實驗結果顯示出它的系統跟那些專為最壞情況最佳化的設計比起來,在效能及耗能上都有極大的增進。雖然如此,他們的系統有著在先進製程上有著難以解決的短路徑問題。在這篇論文裡,我們提出一個時序錯誤偵測系統,由於不需要用一個延遲時脈,所以這個系統並不會有短路徑問題。給定一個原有電路跟一個最大的延遲限度,我們的演算法能夠自動的建造出一個能夠容忍給定的延遲限度的系統。我們的實驗結果顯示出這個系統,在那些最小延遲限制難以達成的設計中,可以當作Razor 的一個良好替代系統。
Delay variation can cause a design to fail its timing specification. Research [5, 12] observes that the worst case of a design is highly improbable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their xperimental results show significant performance or power gain as compared to the worst-case design. However, the architecture in [5, 12] suffers the short path problem which is difficult to resolve in the advanced technology. In this thesis, we propose a Timing Error Detection (TED) architecture without using a delayed clock and therefore the TED architecture is free from the short path problem. Given a design and a maximum delay margin, our algorithm
can automatically construct a TED architecture to tolerate the given delay margin. Our experimental results also show that the TED architecture can be a good alternative for those cases where the minimum delay is difficult to
meet in the advanced technology.
[1] Aseem Agarwal, Vladimir Zolotov, and David T. Blaauw, "Statistical Timing Analysis Using Bounds and Selective Enumeration," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume: 22, Issue: 9, pp. 1243-1260, Sep. 2003.
[2] A. B. Agarwal, D. Blaauw, V. Zolotov, S. Sundareswaran, M. Zhao, K.Gala, and R. Panda, "Path-Based Statistical Timing Analysis Considering Inter-Die and Intra-Die Correlations," Proc. 2002 TAU (ACMIEEE workshop on timing issues in the specification and synthesis of digital
systems), pp. 16-21, December 2002.
[3] E. T. A. F. Jacobs, M. R. C. M. Berkelaar, "Gate Sizing Using a Statistical Delay Model," Proc. of Design, Automation and Test in Europe, pp. 27-30, 2000.
[4] C. Visweswariah, "Death, taxes and failing chips," Proc. of Design Automation Conference, pp. 343-347, June 2-6, 2003.
[5] Dan Ernst, Nam Sung Kim, Shidhartha Das, Sanjay Pant, Rajeev Rao,Toan Pham, Conrad Ziesler, David Blaauw, Todd Austin, Krisztian Flautner, and Trevor Mudge, "Razor: A Low-Power Pipeline Based on Circuit-Level Timing Speculation," 36th Annual International Symposium on Microarchitecture(MICRO-36), pp. 7-18, December 2003.
[6] J. A. G. Jess, K. Kalafala, S. R. Naidu, R. H. J. M Otten, and C.Visweswariah, "Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits," Proc. of Design Automation Conference,
pp. 932-937, June 2-6, 2003.
[7] Jing-Jia Liou, Angela Krstic, Yi-Ming Jiang, and Kwang-Ting Cheng,"Modeling, Testing, and Analysis for Delay Defects and Noise Effects in Deep Submicron Devices," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume: 22 , Issue: 6, pp.
756-769, June 2003.
[8] Shekhar Borkar, Tanay Karnik, Siva Narendra, Jim Tschanz, Ali Keshavarzi, and Vivek De, "Parameter Variations and Impact on Circuits and Microarchitecture," Proc. of Design Automation Coference, pp.338-342, June 2003.
[9] Shin-Chieh Chang, Chen-Tao Hsien, and Kai-ChiangWu, "Re-Synthesis for Delay Variation Tolerance," Proc. of Design Automation Coference, pp. 814-819, June 2004.
[10] Seung Hoon Choi, Bipul C. Paul and Kaushik Roy, "Novel Sizing Algorithm for Yield Improvement under Process Variation in Nanometer Technology," Proc. of Design Automation Conference, pp. 454-459, June 2004.
[11] Sreeja Raj, Sarma B. K. Vrudhula and Janet Wang, "A Methodology to Improve Timing Yield in the Presence of Process Variations," Proc. of Design Automation Conference, pp. 448-453, June 2004.
[12] Todd M. Austin, "Designing Robust Microarchitectures," Proc. of Design Automation Conference, pp. 78, June 2004.