促使交換異向性之材料，已被廣泛的研究應用在高儲存密度之電磁阻感應式讀取頭上。典型的例子:高序化結構的PtMn(反鐵磁層)材料，其會提高自旋閥系統之交換偏移場強度。因此，對於要製造一個良好的自旋閥系統，一個重要的課題就是了解PtMn材料其結構上序化的程度。
在我們研究裡，改變PtMn成分比例、熱退火處理，來探討磊晶PtMn薄膜平面序化結構對PtMn/Ni80Fe20系統交換偏移場之影響。而為何著重於薄膜平面方向之結構的研究，這是因為交換偏移場方向是與膜面同向，但大多數研究，都僅討論垂直膜面方向的序化及結構對交換偏移場的影響，很少討論到膜面上的序化及結構與交換偏移場的關係。而由X-ray分析膜面上序化結構，發現大致上係以序化結果愈大其交換偏移場為最大，而在退火處理發現，交換偏移場隨退火次數增加而增大，且X-ray分析得知經退火處理後其結構序化愈好，並發現在我們樣品系統中PtMn之同調長度及經粒方向雜亂度亦扮演著重要的角色。另外，序化程度約在Mn~50%時為最高。

Extensive studies have been made on exchange bias material for their application in magneto-resistive spin-valve sensors used in high density recording. Typically, a higher degree of ordering of PtMn enhances a stronger exchange bias field of a spin valve. To understand the structure of an ordering PtMn is of importance for fabricating a good spin valve system.
In this work, the relation between the exchange bias field and the in-plane structure of AF (anti-ferromagnetic) PtxMn1-x alloy was studied as functions of Mn compositions and number of annealing cycles. In-plane X-ray diffraction was used to study the in-plane ordering structures. The in-plane direction is emphasized because this direction is the same direction of the exchange field. These in-plane X-ray diffraction results show that the higher degree of chemical ordering for PtMn strongly correlated with the higher values of exchange bias field. The annealing treatment shows that the exchange bias field increases as the number of annealing cycles increase. X-ray diffraction data also show that a better ordered PtMn film was formed after annealing. However, the coherent length and the crystal orientation may play an important role in these samples. In addition, the best ordering sample is the one with Mn composition around 50%.

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