摘要

本研究目的為探討冷滾壓以及1273K熱處理對於快速凝固旋淬法製備的Fe70Pd30-XCuX(X=0.3、0.5、0.7、1、3 at%)鐵磁性形狀記憶合金薄帶在相變化溫度、磁性質、磁伸縮值與形狀記憶效應的影響。
剛製成的Fe70Pd30-XCuX(X=0.7、1、3 at%)記憶合金薄帶中均發現bct相的存在，經過均質化處理後，有效的消除bct相，並且均質化後的試片Fe70Pd29Cu1、Fe70Pd27Cu3在室溫發現fct相的存在。相變化溫度方面，Fe70Pd29Cu1均質化後，Ms 接近318K，Fe70Pd27Cu3均質化後，Ms 接近323K。
Fe70Pd30-XCuX(X=0.7、1、3 at%)記憶合金薄帶，不論是剛快速旋淬製成或是均質化後的室溫飽和磁化量都是Fe70Pd29Cu1、Fe70Pd27Cu3較小而矯頑磁場則是Fe70Pd29Cu1、Fe70Pd27Cu3較大。不施加應力時磁伸縮值方面，剛製成的薄帶Fe70Pd29Cu1、Fe70Pd27Cu3因室溫存在著bct相，所以較低。而均質化後的薄帶Fe70Pd29Cu1、Fe70Pd27Cu3
在室溫存在fct相，不施加應力時磁伸縮值大幅提升。均質化後的薄帶Fe70Pd29Cu1在施加應力與外加磁場9kOe下磁伸縮值表現出920ppm，均質化後的薄帶Fe70Pd29Cu3在施加應力與外加磁場9kOe下磁伸縮值表現出950ppm。
由於剛製成的薄帶Fe70Pd29Cu1、Fe70Pd27Cu3在室溫均呈現bct相，因此不具有形狀記憶的效應。經過均質化後，Fe70Pd29Cu1、Fe70Pd27Cu3試片均表現出雙向記憶的效應。經過50次熱循環後，均質化後的Fe70Pd29Cu1試片保有15%的雙向記憶回復率，均質化後的Fe70Pd29C3試片保有35%的雙向記憶回復率。

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