研究生: |
楊雅薇 Yang,Ya Wei |
---|---|
論文名稱: |
共軛高分子薄膜之分子應力與分子堆積研究 Residual stresses and molecular packing of conjugated polymer thin films |
指導教授: |
楊長謀
Yang, Arnold Chang-Mou |
口試委員: |
戴子安
韋光華 吳逸謨 |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 材料科學工程學系 Materials Science and Engineering |
論文出版年: | 2015 |
畢業學年度: | 103 |
語文別: | 中文 |
論文頁數: | 117 |
中文關鍵詞: | 共軛高分子 、分子堆積 、除潤運動 、光致發光 |
外文關鍵詞: | Conjugated polymer, Molecular packing, Dewetting, Photoluminescence |
相關次數: | 點閱:1 下載:0 |
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本論文主要經由對奈米薄膜不穩除潤過程的精細觀察,量測共軛高分子薄膜內部的分子鏈反彈應力(molecular recoiling stress),並據以探究高分子從溶液旋塗成固態薄膜的演變與分子堆積情形。本研究
所使用的共軛高分子為(poly[2-methoxy-5-((2’-ethylhexyl)oxy)-1,4-phenylenevinylene]) MEH-PPV,並輔以非共軛結構之高分子聚苯乙烯(polystyrene,PS)。我們經由量測奈米薄膜除潤時,在初期孔洞邊緣的應力釋放,以及在複層結構時對彈性基材的彈性形變,發現共軛高分子薄膜有較小的分子應力,此可能與硬桿型分子結構所具有較長的分子堅持長度(Persistence length)和較小的分子亂度有關。此外,在旋塗形成薄膜時,共軛高分子由於硬桿結構,較不易形成阻礙溶劑逸散的表皮層(skin layer),因此,其分子應力對薄膜厚度,呈現單一的指數下降現象,而非一般非共軛高分子的雙指數下降行為。同時,共軛高分子奈米薄膜在旋塗基材寬約2nm的介面層,也有遠較非共軛高分子為小的堆積密度(約為十分之一),此應與旋塗成形時,溶劑揮發造成的分子反彈力較小有關。最後,由於高分子強大的聲子-電子交互作用(electron-phonon coupling),共軛高分子的光電發光效率其實與分子鏈段應力(Segmental stress)密切相關,此薄膜成形時所產生的殘留應力,與高分子光電元件的性能密切相關。
The thesis aims to measure the molecular stresses operative in conjugated polymer molecules and explore their packing in the ultrathin films prepared by spin coating. The conjugated polymer MEH-PPV (poly[2-methoxy-5-((2’-ethylhexyl)oxy)-1,4-phenylenevinylene]) was used as the model polymer in comparison to the non-conjugated polymer polystyrene (PS). The molecular stresses were determined from the thin film instability of dewetting, by measuring the stress release at the edge of an incipient hole or the depression in the soft elastic substrate underneath a dewetting hole. The molecular stresses of the conjugated polymer confined in thin films were found substantially smaller than those of PS. The observation is attributed to the rigid-rod molecular structure that exhibits a longer persistence length and hence a smaller entropy variation for the transition of the molecules from solute to solid film. In addition, the local mass density in the thin (~2nm) interfacial layer next to the substrate was found to be only one tenth of that of PS, believably resulted from the smaller molecular recoiling forces during solvent evaporation. Moreover, in contrast to the double-exponential behavior of flexible-chain polymers such as PS, the molecular stress demonstrated a single exponential decay with film thickness, indicating the absence of skin layer during the rapid solidification of spin coating, which is also attributed to the rigid-rod structure that allows easier passing of the solvent molecules. Since the optoelectronic quantum efficiencies are highly dependent on the segmental stress due to the robust electron-phonon interactions of the linear chains, good control over the residual stress of thin conjugated polymer films plays a fundamental role for the development of polymer-based devices.
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