研究生: |
洪嘉黛 |
---|---|
論文名稱: |
CuInGa三元合金濺鍍及硒化製備之CIGS薄膜 Characteristics of CIGS Thin Film Produced by Sputter Deposition and Post-Selenization |
指導教授: | 吳振名 |
口試委員: |
李奕賢
陳世偉 |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 材料科學工程學系 Materials Science and Engineering |
論文出版年: | 2012 |
畢業學年度: | 100 |
語文別: | 中文 |
論文頁數: | 94 |
中文關鍵詞: | 銅銦鎵硒 、濺鍍 、三元 、硒化 |
外文關鍵詞: | CIGS, sputter, ternary, selenization |
相關次數: | 點閱:2 下載:0 |
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CIGS(Copper Indium Gallium Selenide)是以銅銦鎵硒四種元素合成之黃銅礦相(chalcopyrite)半導體化合物Cu(In, Ga)Se2。因具有1.04─1.67 eV的直接能隙及高穩定性成為薄膜太陽能電池吸收層材料的首選之一。
本實驗主要探討兩個變數,一是濺鍍功率和工作壓力對預製層薄膜有何影響,二是不同的硒化熱處理參數如何改變CIGS薄膜。
實驗結果顯示,低功率、高工作壓力的濺鍍條件下可以得到較平整的銅銦鎵三元合金薄膜預製層,而這一點在文獻中被提及有利於後續的硒化過程。而以XRF的檢測結果看來,即使鍍製的參數有所差異,薄膜成分變動的範圍很小,濺鍍參數不足以成為控制成分的變因,成分的控制要回歸到靶材的熔煉。
硒化熱處理的持溫溫度則以攝氏100、250、350,最後到550度的多階段持溫結果最佳,持溫時間則顯示應拉長250℃的持溫時間,其中升溫速率沒有明顯影響。硒化處理的前置準備中,硒蒸鍍的厚度有一最佳值,起始壓力應維持在微負壓。
KCN處理及元件量測顯示本實驗製備之CIGS薄膜中有Cu2-xSe生成,應減少靶材中銅金屬比例至標準比以下。
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