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研究生： 徐悅芝
論文名稱： 無線測試協定與介面之設計與實作
Design and Implementation of the Wireless Test Protocol and Interface
指導教授： 黃稚存
口試委員:
學位類別： 碩士
Master
系所名稱： 電機資訊學院 - 產業研發碩士積體電路設計專班
Industrial Technology R&D Master Program on IC Design
論文出版年： 2007
畢業學年度： 95
語文別： 中文
論文頁數： 116
中文關鍵詞： 無線測試 、測試介面 、無限測試協定
相關次數： 點閱：2  下載：0 
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    • 隨著製程的演進，系統晶片越來越複雜。而製程的進步讓晶片的測試面臨挑戰，將會有更多的IO介面以及有更高的時間精準度的需求。然而依照目前傳統的測試方式，依靠擴增測試機台設備所需付出的成本甚鉅，因此有新的測試方法被提出 — HOY (使用無線測試的方式來解決未來測試所面臨的問題)。
    無線測試被提出應用在現今的晶片製造，藉此可以取代在晶圓測試中，耗費許多成本的探測卡，並利用平行測試可以減少測試時間，提高測試產能。從接觸式的測試到無線傳輸測試需要有無線傳輸協定。因而我們提出了針對無線測試系統的測試傳輸協定，以及定義了一個標準化的測試介面。標準化的介面可以讓無線測試模組IP化，簡化因無線測試所需要的發展時間。我們所發展的測試介面目前已經成功運用在MBIST、MBISD、以及PLL BIST上。
    最後，我們的系統整合在FPGA上做驗證及展示，透過我們展示團隊的合作，利用RF模組傳輸測試資料，展示了一個2x2 的平行測試系統。

    1 Introduction 1 1.1 Traditional Testing Background and Issue 1.2 HOY System 1.2.1 Hypothesis 1.2.2 Odyssey 1.2.3 Yield 1.3 Proposed Approach 2 Related Works 9 2.1 Previous Works 2.2 Test Management Unit 3 HOY Test Protocol and Test Interface 3.1 Test Interface 3.1.1 BB-MAC Interface and IO Definition 3.1.2 DEU-HTW Interface and IO Definition 3.2 HOY Protocol 3.2.1 MAC Protocol 3.2.2 HOY Test Protocol 3.2.2.1 Test Request Protocol 3.2.2.2 Test Response Protocol 3.2.3 Software Reset Procedure 3.3 Test Interface Timing Diagram 3.3.1 BB-MAC Timing Diagram 3.3.1.1 MAC TX Control Timing Diagram 3.3.1.2 MAC RX Control Timing Diagram 3.3.2 DEU Communication Timing Diagram 3.3.2.1 Global Control Timing Diagram 3.3.2.2 Instruction Buffer Control Timing Diagram 3.3.2.3 Data Buffer Control Timing Diagram 3.3.2.4 Response Data Buffer Control Timing Diagram 3.4 Test Flow Example 3.5 Test Time Evaluation 3.5.1 A Time Intensive Example for HOY 3.5.2 A Data Intensive Example for HOY 3.6 Summary 4 HOY Prototype System 81 4.1 Software 4.2 Hardware 4.2.1 Tester Serial Interface and PL2303 4.2.2 RF Module 4.2.3 MAC Implementation 4.2.4 DEU Implementation 4.3 Experiment Environment and Setup 4.3.1 Procedure 4.3.2 Experiment 4.3.2.1 Experiment Result 4.4 HOY Test Chip Implementation and Verification 4.4.1 Simulation Material 4.5 Experiment Result and Analysis 5 Conclusion and Future Work 5.1 Conclusion 5.2 Future Work

    [1] P.-K. Chen, Y.-T. Hsing, and C.-W. Wu, \On feasibility of HOY|a wireless test methodology for VLSI chips and wafers", in Proc. Int'l Symp. on VLSI Design, Au-
    tomation, and Test (VLSI-DAT), Hsinchu, Apr. 2006.
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    [5] J. G. Casta no, M. EkstrÄom, R. Hodia, D. ºAberg, and Y. BÄacklund, "Wireless ieee 488.2 test system based on bluetoothTM", in IEEE AUTOTESTCON. IEEE Systems Readiness Technology Conference. (AUTOTESTCON), 2003, pp. 518{526.
    [6] Hans Eberle, "Radioport: A radio network for monitoring and diagnosing computer systems", Technical report, Sun Microsystem Laboratory, 2600 Casey Avenue Mountain
    View, CA 94043, Oct. 2002.
    [7] Hans Eberle and Arvinderpal Wander, \Testing systems wirelessly", in Proc. IEEE VLSI Test Symp. (VTS), 2004, pp. 335{340.
    [8] Chipcon AS., \CC2500 | single chip low cost low power RF transceiver", http://www.chipcon.com/, December, 2004.
    [9] T.-W. Ko, Y.-T Hsing, C.-W Wu, and C.-T Huang, \Stable performance MAC protocol for HOY wireless tester under large population", 2007.
    [10] Mischa Schwartz., Telecommunication networks :protocols, modeling, and analysis,
    Addison-Wesley, 1987.

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