研究生: |
黃旆齊 Huang, Pei-Chi |
---|---|
論文名稱: |
多波長外差式干涉儀位移量測技術 Displacement Measurement by Multi-Wavelength Heterodyne Interferometry |
指導教授: |
楊尚達
Yang, Shang-Da |
口試委員: |
楊尚達
李朱育 施宙聰 |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 光電工程研究所 Institute of Photonics Technologies |
論文出版年: | 2013 |
畢業學年度: | 101 |
語文別: | 英文 |
論文頁數: | 43 |
中文關鍵詞: | 位移量測 、干涉儀 |
外文關鍵詞: | absolute distance, interferometry |
相關次數: | 點閱:2 下載:0 |
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在本論文中,我們提出一個改良式多波長外差式干涉儀位移量測技術。首先,我們量測不同波長的相位並利用所組成的數組來決定位移,以避免過去使用相位差來一步步估計位移時產生的累積相位錯誤,因此提升了在相同實驗環境下可量測的最大距離。再者,我們修正了當所提供振幅不等於電光效應相位調變器之半波電壓的鋸齒波所造成的錯誤,進而讓我們得以使用單一個電光效應相位調變器來提供相位延遲給不同波長的單頻雷射,大大簡化了實驗的複雜度。在實驗上,我們成功地藉由三波長外差式干涉儀達到1公分的量測距離,0.57奈米的精準度以及33赫茲的量測速度。
1. N. A. Massie, R. D. Nelson, and S. Holly, "High-performance real-time heterodyne interferometry", Applied Optics 18, 1797-1803 (1979).
2. A. F. Fercher, H. Z. Hu, and U. Vry, “Rough surface interferometry with a two-wavelength heterodyne speckle interferometer”, Applied Optics 24, 2181-2188 (1985).
3. R. Dändliker, R. Thalmann, and D. Prongué, "Two-wavelength laser interferometry using superheterodyne detection", Optics Letters 13, 339-341 (1988).
4. E. Gelmini, U. Minoni, and F. Docchio, "Tunable, double-wavelength heterodyne detection interferometer for absolute-distance measurements", Optics Letters 19, 213-215 (1994).
5. D. C. Su, M. H. Chiu and C. D. Chen, "A heterodyne interferometer using an electro-optic modulator for measuring small absolute distances", Journal of Optics 27, 19-23 (1996).
6. K. H. Bechstein and W. Fuchs, "Absolute interferometric distance measurements applying a variable synthetic wavelength", Journal of Optics 29, 179-182 (1998).
7. R. Dändliker, Y. Salvadé and E. Zimmermann, "Distance measurement by multiple-wavelength interferometry", Journal of Optics 29, 105-114 (1998).
8. S. Yokoyama, T. Yokoyama and T. Araki, "High-speed subnanometre interferometry using an improved three-mode heterodyne interferometer", Measurement Science and Technology 16, 1841-1847 (2005).
9. C. C. Hsu, C. C. Wu, J. Y. Lee, H. Y. Chen and H. F. Weng, "Reflection type heterodyne grating interferometry for in-plane displacement measurement", Optics Communications 281, 2582-2589 (2008).
10. J. Y. Lee, H. Y. Chen, C. C. Hsu and C. C. Wu, "Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution", Sensors and Actuators A 137, 185-191 (2007).
11. H. L. Hsieh, J. Y. Lee, W. T. Wu, J. C. Chen, R. Deturche and G. Leronde, "Quasi-common-optical-path heterodyne grating interferometer for absolute distance measurement", Measurement Science And Technology 21, 115304 (2010).
12. N. Schuhler, Y. Salvadé, S. Lévêque, R. Dändliker, and R. Holzwarth, "Frequency-comb-referenced two-wavelength source for absolute distance measurement", Optics Letters 31, 3101-3103 (2006).
13. Y. Salvadé, N. Schuhler, S. Lévêque, and S. L. Floch, "High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source", Applied Optics 47, 2715-2720 (2008).
14. S. Hyun, Y. J. Kim, Y. Kim, J. Jin and S. W. Kim, "Absolute length measurement with the frequency comb of a femtosecond laser", Measurement Science and Technology 20, 115304 (2009).