在本論文裡主要討論磁性隨機存取記憶體的測試及診斷，首先針對磁性隨機存取記憶體（Magnetic Random Access Memory，MRAM）特有的錯誤模型－寫入干擾錯誤（Write Disturbance Fault，WDF）提出特有的偵測方法－回讀（Read-previous），並討論它對其他傳統錯誤模型偵測上的影響，另外針對不同置亂架構（Scrambling
Architecture）的磁性隨機存取記憶體也有不同的測試方法。另外我們針對磁性隨機存取記憶體提出二>個工具：磁性隨機存取記憶體錯誤模擬器（Magnetic Random Access Memory Simulator for Error
Screening，RAMSES-M）及磁性隨機存取測試及診斷記憶體演算法產生器（Test and Diagnosis Algorithm Generator by Simulation for MRAM，TAGS-M）。除了支援傳統常見的錯誤模型，RAMSES-M和TAGS-M支援回讀及權重錯誤（Weighted Fault）的觀念，我們針對寫入干擾錯誤提出權重錯誤，期冀能更準確的評估演算法的測試能力，而在本文裡同時也討論針對寫入干擾錯誤決定權重的方法。最後我們比較TAGS-M產生的演算法和傳統March演算法的測試及診斷能力，由RAMSES-M的實驗數據和實際晶片的量測數據顯示，包含回讀的演算法具有較好>的測試及診斷能力。另外，量測數據同時包含Bitmap Viewer和錯誤症狀（fault syndrome）的分佈，而這些結果也幫助我們發展更多測試方法來了解磁性隨機存取記憶體的問題。

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