研究生: |
蔡光憲 Gwan-Xiang Tsai |
---|---|
論文名稱: |
五軸雷射掃瞄機之研究與開發 Development of High Precision Five-Axis Laser Scanning System |
指導教授: |
雷衛台
Wei-Tai Lei |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 動力機械工程學系 Department of Power Mechanical Engineering |
論文出版年: | 2006 |
畢業學年度: | 94 |
語文別: | 中文 |
論文頁數: | 88 |
中文關鍵詞: | 五軸雷射掃瞄系統 、全周面掃瞄 、誤差模型 、誤差補償 |
相關次數: | 點閱:3 下載:0 |
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本論文針對待測微小工件進行全周面量測,建立一五軸雷射掃瞄機系統,包括軟體與硬體,結合量測與安裝校正方法發展了一套誤差模型來描述此五軸雷射掃瞄機在進行量測時的情形,以便找出機器之誤差源予以補償並做為日後改進的準則,並可利用此模型來將機械量測位置還原至正確的工件座標位置,以提升量測精度。
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