本研究在理論方面介紹了雙臂頻譜干涉儀(Two-arms spectral interferometry)，以及單臂頻譜干涉儀(One-arm spectral interferometry)兩種色散測量的機制。並且介紹了三種後段解析的方法。在實驗方面我們使用1-m的單膜光纖(single mode fiber)以及，0.98-m的色散補償光纖(dispersion compensation fiber)作為待測物，使用雙臂頻譜干涉儀作測量。並且對其穩定性做定量的分析。接著使用擁有高穩定特性的單臂頻譜干涉儀，將所需求的材料厚度推向毫米等級(3.2-mm的矽材質)。最後使用雙臂及單臂頻譜干涉儀對4-mm矽奈米線(silicon wire)作測量，但都無法對其色散資訊做有效的測量。我們針對所得到的錯誤資訊作推測，歸納出可能產生錯誤的原因以及可能解決的方法

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