Reducing Both Shift and Capture Power Dissipation During the Scan-Based At-Speed Test

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研究生：	施純儒 Chun-Ru Shih
論文名稱：	Reducing Both Shift and Capture Power Dissipation During the Scan-Based At-Speed Test 降低延遲錯誤測試中所消耗的功率
指導教授：	張慶元 Tsin-Yuan Chang
口試委員:
學位類別：	碩士 Master
系所名稱：	電機資訊學院 - 電機工程學系 Department of Electrical Engineering
論文出版年：	2008
畢業學年度：	96
語文別：	英文
論文頁數：	50
中文關鍵詞：	降低功率、自動化測試樣本產生程式、不確定值填充
外文關鍵詞：	low power, ATPG, X-filling
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Recently, scan test model has some challenge on test data volume and power dissipation during scan test. Large test data volume results in large test application time which causes expensive test cost. Excess power dissipation in shift cycles raises test temperature and may destroy the Circuit Under Test (CUT). Excess power dissipation in capture cycles results in large IR-drop which causes scan cell malfunctioned during at-speed test. In this thesis, an ATPG program considering delay fault model, low pattern count, and low power dissipation is proposed. And an X-compaction method to reduce test pattern count is proposed, too. Also, an X-filling method, Adjustable Preferred and Adjacent Fill (APAF), is proposed to reduce both shift and capture power during scan test.

近年來在晶片掃描測試上有一些挑戰，包括了龐大的測試資料和高功率消耗。而龐大的測試資料會使得測試的時間提升，進而讓測試時的成本提高。測試時高功率的消耗可分兩方面來討論，第一方面是在移動週期的時候，過高的功率消耗會導致整個待測電路的溫度太高，這可能會使得待測電路燒毀在測試的流程中；而另一方面，在捕捉週期的時候，過高的功率消耗會使得測試時電壓瞬間下降太多，導致測試元件發生錯誤，所以捕捉到的值會是錯誤的，而會使得在測試的準確信下降。本篇論文提出了一個自動化測試樣本產生程式，能夠產生低測試樣本、低功率消耗的樣本組。本篇論文也針對了低測試樣本提出了一個名為不確定值精簡 (X-Compaction)的方法。此外，本篇論文還針對了低功率消耗提出了一個調整式首選鄰近填充法(APAF)。

List of Contents
誌謝……………………………………………………………………    I
Abstract………………………………………………………………..    II
中文摘要………………………………………………………………    III
目錄……………………………………………………………………    IV
List of Contents………………………………………………………..    XI
List of Figures…………………………………………………………    XIII
List of Tables………………………………………………………......    XIV
Chapter 1.  Introduction……………………………………………...    1
Chapter 2.  Preliminary…….………………………………………...    4
      2.1 Scan Test for Transition Delay Fault ……………………    4
        2.2 Evaluation of Power Consumption…...…….……………    6
2.3 Previous Works…………………………………………..    7
2.3.1 Relaxation Technique [19]………………………..    8
2.3.2 Essential Fault Pruning [18]……………………….    9
2.3.3 Dynamic Compaction Flow with X-Limit [11]……    12
2.3.4 Capture-Aware Test Cube Generation [8]………….    13
2.3.5 Single-Capture Low-Capture-Power X-Filling [20].    16
2.3.6 Preferred Fill and Its Relative X-Filling Method [14][15][16]……………………………………………...    18
Chapter 3.  Proposed ATPG Program and X-filling Method………...    21
       3.1 Proposed ATPG Program……...…………………………    23
3.1.1 LOS and LOC Test Model…...…………………….    23
3.1.2 Reducing Test Pattern Count….…………………...    26
3.1.3 Reducing Test Power Dissipation………………….    26
       3.2 Proposed X-Compaction Method……….……….……….    27
       3.3 Proposed Adjustable Preferred and Adjacent Fill (APAF).    29
3.3.1 Step 1: Generate Pattern by ATPG with Dynamic Compaction Flow………………………………….    31
3.3.2 Step 2: Calculate Signal Probabilities……………...    32
3.3.3 Step 3: Fill Unspecified Bits……………………….    33
3.3.4 Step 4: Fault Simulation and Dropping……………    35
3.3.5 Example for Proposed APAF………………………    36
Chapter 4.  Experimental Results………………...…………………..    38
       4.1 Experimental Results on Proposed X-Compaction.....…...    38
       4.2 Experimental Results on Proposed APAF……………...     41
Chapter 5.  Conclusions & Future Works……………………………        46
       5.1 Conclusions………………………………………………    46
       5.2 Future Works……………………………………………..    47
Bibliography…………………………………………………………..    48




List of Figure
Fig. 2.1    (a) Launch-off-shift and (b)Launch-off-capture................    5
Fig. 2.2    Main algorithm of relaxation technique    9
Fig. 2.3    Algorithm of essential fault pruning…………….………    11
Fig. 2.4    Procedure of dynamic compaction flow with X-limit...…    13
Fig. 2.5    Flow char of capture-aware test cube generation………..    16
Fig. 2.6    Procedure of SC-LCP X-filling method………….……...    18
Fig. 2.7    Signal probability of preferred fill……………………….     19
Fig. 3.1    Procedure of proposed X-compaction method…………..    29
Fig. 3.2    The procedure of proposed APAF………………...……..    31
Fig. 3.3    Signal probabilities of proposed APAF…...……………..    33
Fig. 3.4    Example for proposed APAF………………..…………...    37
















List of Tables
Table 4.1    Experimental results of EFP and proposed X-compaction method..………………………………………………….    39
Table 4.2    Normalized experimental data of pattern count and CPU time…………………………………………………….....    40
Table 4.3    Pattern count and fault coverage…………………………    42
Table 4.4    Normalized peak power reduction in launch cycle………    43
Table 4.5    Normalized peak power reduction in capture cycle……..    44
Table 4.6    Normalized average power reduction in shift cycles…….    45

                                

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[14] S. Remersaro, X. Lin, Z. Zhang, S. M. Reddy, I. Pomeranz, and J. Rajski, “Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.” Proc. of IEEE International Test Conference (ITC), page 1-10, Oct. 2006.

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