研究生: |
魏大華 Da-Hua Wei |
---|---|
論文名稱: |
鐵/鉑磊晶多層膜之磁性質及微結構研究 Magnetic Properties and Microstructure of Epitaxial Fe/Pt Multilayers |
指導教授: |
金重勳
Tsung-Shune Chin 姚永德 Yeong-Der Yao |
口試委員: | |
學位類別: |
博士 Doctor |
系所名稱: |
工學院 - 材料科學工程學系 Materials Science and Engineering |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 英文 |
論文頁數: | 173 |
中文關鍵詞: | 分子束磊晶 、鐵/鉑 、磁翻轉行為 、銀拴固層 、氧化物插入層 |
外文關鍵詞: | molecular beam epitaxy, Fe/Pt, magnetization reversal behavior, Ag pinning layer, Oxide insert layer |
相關次數: | 點閱:2 下載:0 |
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本論文利用分子束磊晶技術在氧化鎂(001)基板上製備垂直磁化鐵-鉑多層膜,探討其結構、表面形貌及磁性質。厚度效應藉由增加膜厚來系統化的控制薄膜形貌,從顆粒到連續狀,研究磁翻轉機制與表面形貌的關係。結果顯示:隨膜層厚度增加,磁翻轉過程由Stoner-Wohlfarth旋轉主導之模式偏移向磁壁運動模式。
藉由鉑及鐵緩衝層來研究應變效應對鐵-鉑合金薄膜序化程度的影響。鉑緩衝層導致張應變使鐵-鉑薄膜在320 oC序化,然而鐵緩衝層會完全擴散進鐵-鉑薄膜內,使鐵-鉑薄膜改變為富鐵的組成,造成序化度的降低。
我們首次發現在鐵-鉑薄膜內對稱性導入銀拴固複層,在相同總厚度下效果遠遠大於單一銀拴固層。此方法能大幅增加鐵-鉑薄膜的矯頑磁力,是由於對稱性拴固層能造成更均勻的拴固點分佈而抑制磁壁的位移。藉由銅頂層覆蓋於鐵-鉑薄膜的方式,不僅提昇薄膜序化度,而且降低晶粒間的交互作用力,導致鐵-鉑薄膜矯頑磁力的增加。
氧化物插入層效應研究,是藉由導入氧化鎂及二氧化矽插入層於鐵-鉑薄膜內,達到抑制晶粒成長及磁性顆粒隔絕的目的。此方法能成功地減低晶粒尺寸及抑制晶粒間的交互作用力。
This work has focused on the study of structure, morphology, and magnetic properties of the perpendicularly magnetized Fe/Pt epitaxial films on MgO (001) substrate by using the molecular beam epitaxy technique. We systematically controlled film morphology from isolated to continuous states with increasing film thickness to study the relationship between the morphology and magnetization reversal processes. The dominant magnetization reversal was found to change from Stoner-Wohlfarth rotation type to a domain-wall motion type as increasing film thickness. The Pt and Fe buffer layers were used to investigate the strain effect on the ordering of FePt films. The Pt buffer layer induces tensile strain that leads to lower ordering temperature of FePt films at 320 oC. Due to the full diffusion of Fe buffer layer into FePt films forming Fe-rich off-stoichiometric composition, the degree of chemical ordering is reduced. We first found that the insertion of symmetric Ag pinning layers (APL) into FePt films effectively enhances the coercivity much better than a single APL of the same total thickness. That is due to the relatively uniform-distributed defects than that of a single APL induced pinning effects to impede domain wall movement. A Cu layer on top of the FePt films not only promotes the chemical ordering but also reduces the intergranular exchange coupling to cause the coercivity enhancement. We aimed to reduce the grain size via introducing the MgO and SiO2 insert layers into Fe/Pt films for magnetic isolation. The methods successfully suppressed the grain growth of FePt films leading to decrease the coupling strength between grains.
[1] P. L. Lu and S. H. Charap, IEEE Trans. Magn. 30, 4230 (1994).
[2] P. L. Lu and S. H. Charap, IEEE Trans. Magn. 31, 2767 (1995).
[3] S. H. Charap, P. L. Lu, and Y. He, IEEE Trans. Magn. 33, 978 (1997).
[4] S. Iwasaki and K. Takemura, IEEE Trans. Magn. 11, 1173 (1975).
[5] S. Iwasaki and Y. Nakamura, IEEE Trans. Magn. 14, 436 (1978).
[6] S. Iwasaki, IEEE Trans. Magn. 16, 71 (1980).
[7] http://www.hitachigst.com.html/.
[8] N. A. Spaldin, Magnetic Materials: Fundamentals and Device Applications, Syndicate of the University of Cambridge, 2003, pp. 73.
[9] M. P. Sharrock and J. T. Mckinney, IEEE Trans. Magn. 17, 3020 (1981).
[10] M. P. Sharrock, IEEE Trans. Magn. 20, 754 (1984).
[11] M. Alex, D. Wachenschwanz, IEEE Trans. Magn. 35, 2796 (1999).
[12] M. P. Sharrock, J. Appl. Phys. 76, 6413 (1994).
[13] H. N. Bertram, H. Zhou, and R. Gustafson, IEEE Trans. Magn. 34, 1845 (1998).
[14] S. H. Charap, P. L. Lu, and Y. He, IEEE Trans. Magn. 33, 978 (1997).
[15] D. Weller and A. Moser, IEEE Trans. Magn. 35, 4423 (1999).
[16] A. Ajan, E. N. Abarra, B. R. Acharya, A. Inomata, I. Okamoto, and M. Shinohara, Appl. Phys. Lett. 82, 1075 (2003).
[17] O. A. Ivanov, L. V. Solina, V. A. Demshina, and L. M. Magat, Fiz. Metal. Metalloved. 35, 81 (1973).
[18] R. F. C. Farrow, D. Weller, R. F. Marks, M. F. Toney, A. Cebollada, and G. R. Harp, J. Appl. Phys. 79, 5967 (1996).
[19] D. Weller, A. Moser, L. Folks, M. E. Best, W. Lee, M. F. Toney, M. Schwickert, J. U. Thiele, and M. F. Doerner, IEEE Trans. Magn. 36, 10 (2000).
[20] H. Kanazawa, G. Lauhoff, and T. Suzuki, J. Appl. Phys. 87, 6143 (2000).
[21] G. H. O. Daalderop, P. J. Kelly, and M. F. H. Schuurmans, Phys. Rev. B 44, 12054 (1991).
[22] A. Sakuma, J. Phys. Soc. Jpn. 63, 3053 (1994).
[23] A. B. Shick and O. N. Mryasov, Phys. Rev. B 67, 172407 (2003).
[24] M. A. I. Nahid and T. Suzuki, Appl. Phys. Lett. 85, 4100 (2004).
[25] M. Podgórny, Phys. Rev. B 43, 11300 (1991).
[26] S. Maat, A. J. Kellock, D. Weller, J. E. E. Baglin, and Eric E. Fullerton, J. Magn. Magn. Mater. 265, 1 (2003).
[27] S. Okamoto, N. Kikuchi, O. Kitakami, T. Miyazaki, Y. Shimada, and K. Fukamichi, Phys. Rev. B 66, 024413 1-9 (2002).
[28] A. B. Shick and O. N. Mryasov, Phys. Rev. B 67, 172407 1-4 (2003).
[29] A. Cellollada, D. Weller, J. Sticht, G. R. Harp, R. F. C. Farrow, R. Marks, R. Savoy, and J. C. Scott, Phys. Rev. B 50, 3419 (1994).
[30] C. P. Luo and D. J. Sellmyer, IEEE Trans. Magn. 31, 2764 (1995).
[31] Y. Endo, N. Kikuchi, O. Kitakami, and Y. Shimada, J. Appl. Phys. 89, 7065 (2001).
[32] T. Shima, T. Moriguchi, S. Mitani, and K. Takanashi, Appl. Phys. Lett. 80, 288 (2002).
[33] T. Shima, T. Moriguchi, S. Mitani, K. Takanashi, H. Ito, and S. Ishio, IEEE Trans. Magn. 38, 2791 (2002).
[34] T. Shima, T. Moriguchi, T. Seki, S. Mitani, and K. Takanashi, J. Appl. Phys. 93, 7238 (2003).
[35] S. C. Chou, C. C. Yu, Y. Liou, Y. D. Yao, D. H. Wei, T. S. Chin, and M. F. Tai, J. Appl. Phys. 95, 7276 (2004).
[36] D. H. Wei, S. C. Chou, T. S. Chin, C. C. Yu, Y. D. Yao, and Y. Liou, IEEE Trans. Magn. 41, 912 (2005).
[37] D. Ravelosona, C. Chappert, V. Mathet, and H. Bernas, Appl. Phys. Lett. 76, 236 (2000).
[38] D. Ravelosona, C. Chappert, V. Mathet, and H. Bernas, J. Appl. Phys. 87, 5771 (2000).
[39] C. H. Lai, C. H. Yang, and C. C. Chiang, Appl. Phys. Lett. 83, 4550 (2003).
[40] O. Kitakami, Y. Shimada, K. Oikawa, H. Daimon, and K. Fukamichi, Appl. Phys. Lett. 78, 1104 (2001).
[41] H. Yamaguchi, O. Kitakami, S. Okamoto, Y. Shimada, K. Oikawa, and K. Fukamichi, Appl. Phys. Lett. 79, 2001 (2001).
[42] S. R. Lee, S. H. Yang, Y. K. Kim, and J. G. Na, Appl. Phys. Lett. 78, 4001 (2001).
[43] S. R. Lee, S. H. Yang, Y. K. Kim, and J. G. Na, J. Appl. Phys. 91, 6857 (2002).
[44] T. Maeda, T. Kai, A. Kikitsu, T. Nagase, and J. Akiyama, Appl. Phys. Lett. 80, 2147 (2002).
[45] T. Kai, T. Maeda, A. Kikitsu, J. Akiyama, T. Nagase, and T. Kishi, J. Appl. Phys. 95, 609 (2004).
[46] Y. K. Takahashi, M. Ohnuma, and K. Hono, J. Magn. Magn. Mater. 246, 259 (2002).
[47] C. L. Platt, K. W. Wierman, E. B. Svedberg, R. van de Veerdonk, J. K. Howard, A. G. Roy and D. E. Laughlin, J. Appl. Phys. 92, 6104 (2002).
[48] K. Nishimura, K. Takahashi, H. Uchida and M. Inoue, J. Magn. Magn. Mater. 272, 2189 (2004).
[49] S. C. Chen, P. C. Kuo, S. T. Kuo, A. C. Sun, C. T. Lie, C. Y. Chou, Mat. Sci. Eng B. 98, 244 (2003).
[50] S. C. Chen, P. C. Kuo, S. T. Kuo, A. C. Sun, C. Y. Chou, and Y. H. Fang, IEEE Trans. Magn. 41, 915 (2005).
[51] Z. L. Zhao, J. Ding, K. Inaba, J. S. Chen, and J. P. Wang, Appl. Phys. Lett. 83, 2196 (2003).
[52] Z. L. Zhao, K. Inaba, Y. Ito, J. S. Chen, B. H. Liu, J. Ding, and J. P. Wang, J. Appl. Phys. 95, 7154 (2004).
[53] Z. L. Zhao, J. Ding, J. B. Yi, J. S. Chen, J. H. Zeng, and J. P. Wang, J. Appl. Phys. 97, 10H502 (2005).
[54] M. Watanabe, M. Homma, and T. Masumoto, J. Magn. Magn. Mater. 177, 1231 (1998).
[55] J. C. Shih, H. H. Hsiao, J. L. Tsai, and T. S. Chin, IEEE Trans. Magn. 37, 1280 (2001).
[56] A. C. Sun, P. C. Kuo, S. C. Chen, C. Y. Chou, H. L. Huang and J. H. Hsu, J. Appl. Phys. 95, 7264 (2004).
[57] T. Seki, T. Shima, K. Takanashi, Y. Takahashi, E. Matsubara, and K. Hono, Appl. Phys. Lett. 82, 2461 (2003).
[58] Y. N. Hsu, S. Jeong, D. E. Laughlin, and D. N. Lambeth, J. Appl. Phys. 89, 7068 (2001).
[59] Y. N. Hsu, S. Jeong, D. E. Laughlin, and D. N. Lambeth, J. Magn. Magn. Mater. 260, 282 (2003).
[60] S. C. Chen, P. C. Kuo, C. Y. Chou, and A. C. Sun, J. Appl. Phys. 97, 10N107 (2005).
[61] Y. F. Xu, J. S. Chen, and J. P. Wang, Appl. Phys. Lett. 80, 3325 (2002).
[62] Y. F. Xu, J. S. Chen, D. Y. Dai, and J. P. Wang, IEEE Trans. Magn. 38, 2042 (2002).
[63] J. S. Chen, Y. F. Xu, and J. P. Wang, J. Appl. Phys. 93, 1661 (2003).
[64] Y. F. Ding, J. S. Chen, E. Liu, and J. P. Wang, J. Magn. Magn. Mater. 285, 443 (2005).
[65] T. Seki, T. Shima, K. Takanashi, Y. Takahashi, E. Matsubara, Y. K. Takahashi, and K. Hono, J. Appl. Phys. 96, 1127 (2004).
[66] S. Shiomi, T. Nakakita, R. Tanaka, T. Kobayashi, and M. Masuda, Jpn. J. Appl. Phys. 35, L213 (1996).
[67] C. H. Park, J. G. Na, P. W. Jang, and S. R. Lee, IEEE Trans. Magn. 35, 3034 (1999).
[68] H. H. Hsiao, R. N. Panda, J. C. Shih, and T. S. Chin, J. Appl. Phys. 91, 3145 (2002).
[69] K. Leistner, J. Thomas, H. Schlőrb, M. Weisheit, L. Schultz, and S. Fähler, Appl. Phys. Lett. 85, 3498 (2004).
[70] C. H. Lai, Y. C. Wu, and C. C. Chiang, J. Appl. Phys. 97, 10H305 (2005).
[71] H. Y. Wang, X. K. Ma, Y. J. He, S. Mitani, and M. Motokawa, Appl. Phys. Lett. 85, 2304 (2004).
[72] C. H. Lai, C. H. Yang, C. C. Chiang, T. Balaji, and T. K. Tseng, Appl. Phys. Lett. 85, 4430 (2004).
[73] J. D. Livingston, J. Appl. Phys. 52, 2544 (1981).
[74] J. P. Attané, Y. Samson, A. Marty, D. Halley, and C. Beigné, Appl. Phys. Lett. 79, 794 (2001).
[75] S. Jeong, T. Ohkubo, A. G. Roy, D. E. Laughlin, and M. E. McHenry, J. Appl. Phys. 91, 6863 (2002).
[76] Y. Z. Zhou, J. S. Chen, G. M. Chow, and J. P. Wang, J. Appl. Phys. 95, 7495 (2004).
[77] D. Halley, Y. Samson, A. Marty, P. B. Guillemaud, C. Beigne, B. Gilles, and J. E. Mazille, Phys. Rev. B 65, 205408 (2002).
[78] Z. L. Zhao, J. Ding, J. S. Chen, and J. P. Wang, J. Magn. Magn. Mater. 272, 2186 (2004).
[79] Z. L. Zhao, J. S. Chen, J. Ding, K. Inaba, and J. P. Wang, J. Magn. Magn. Mater. 282, 105 (2004).
[80] Z. L. Zhao, J. P. Wang, J. S. Chen, and J. Ding, Appl. Phys. Lett. 81, 3612 (2002).
[81] Z. L. Zhao, J. Ding, J. S. Chen, and J. P. Wang, J. Appl. Phys. 93, 7753 (2003).
[82] A. A. Kündig, N. Abe, M. Ohnuma, T. Ohkubo, H. Mamiya, and K. Hono, Appl. Phys. Lett. 85, 789 (2004).
[83] Y. K. Takahashi, T. O. Seki, K. Hono, T. Shima, and K. Takanashi, J. Appl. Phys. 96, 475 (2004).
[84] T. Shimatsu, J. C. Lodder, Y. Sugita, and Y. Nakamura, IEEE Trans. Magn. 35, 2697 (1999).
[85] N. Li, B. M. Lairson, and O. H. Kwon, J. Magn. Magn. Mater. 205, 1 (1999).
[86] J. A. Christodoulides, Y. Zhang, G. C. Hadjipanayis, and C. Fountzoulas, IEEE Trans. Magn. 36, 2333 (2000).
[87] J. A. Christodoulides, Y. Huang, Y. Zhang, G. C. Hadjipanayis, I. Panagiotopoulos, and D. Niarchos, J. Appl. Phys. 87, 6938 (2000).
[88] P. C. Kuo, Y. D. Yao, C. M. Kuo, and H. C. Wu, J. Appl. Phys. 87, 6146 (2000).
[89] C. M. Kuo, P. C. Kuo, W. C. Hsu, C. T. Li, and A. C. Sun, J. Magn. Magn. Mater. 209, 100 (2000).
[90] C. M. Kuo and P. C. Kuo, J. Appl. Phys. 87, 419 (2000).
[91] P. C. Kuo, S. C. Chen, Y. D. Yao, A. C. Sun, and C. C. Chiang, J. Appl. Phys. 91, 8638 (2002).
[92] S. C. Chen, P. C. Kuo, A. C. Sun, C. T. Li, and C. C. Chiang, IEEE Trans. Magn. 39, 584 (2003).
[93] S. C. Chen, P. C. Kuo, C. T. Lie, and J. T. Hua, J. Magn. Magn. Mater. 236, 151 (2001).
[94] S. C. Chen, P.C. Kuo, A. C. Sun, C. T. Li, and W. C. Hsu, Mat. Sci. Eng B. 88, 91 (2002).
[95] H. S. Ko, A. Perumal, and S. C. Shin, Appl. Phys. Lett. 82, 2311 (2003).
[96] A. Perumal, H. S. Ko, and S. C. Shin, Appl. Phys. Lett. 83, 3326 (2003).
[97] A. Perumal, H. S. Ko, S. C. Shin, IEEE Trans. Magn. 39, 2320 (2003).
[98] Y. Zhang, J. Wan, M. J. Bonder, G. C. Hadjipanayis, and D. Weller, J. Appl. Phys. 93, 7175 (2003).
[99] B. Bian, K. Sato, Y. Hirotsu, and A. Makino, Appl. Phys. Lett. 75, 3686 (1999).
[100] M. Watanabe, T. Masumoto, D. H. Ping, and K. Hono, Appl. Phys. Lett. 76, 3971 (2000).
[101] D. H. Ping, M. Ohnuma, K. Hono, M. Watanabe, T. Iwasa, and T. Masumoto, J. Appl. Phys. 90, 4708 (2001).
[102] J. Bai, Z. Yang, F. Wei, M. Matsumoto, and A. Morisako, J. Magn. Magn. Mater. 257, 132 (2003).
[103] M. Matsumoto, A. Morisako, N. Katayama, J. Appl. Phys. 93, 7169 (2003).
[104] Y. K. Takahashi and K. Hono, Appl. Phys. Lett. 84, 383 (2004).
[105] C. P. Luo, S. H. Liou, L. Gao, Y. Liu, and D. J. Sellmyer, Appl. Phys. Lett. 77, 2225 (2000).
[106] T. Suzuki and K. Ouchi, IEEE Trans. Magn. 37, 1283 (2001).
[107] S. Jeong, A. G. Roy, D. E. Laughlin, and M. E. McHenry, J. Appl. Phys. 91, 8813 (2002).
[108] Y. Zhang, J. Wan, V. Skumryev, S. Stoyanov, Y. Huang, G. C. Hadjipanayis, and D. Weller, Appl. Phys. Lett. 85, 5343 (2004).
[109] D. H. Wei, S. C. Chou, T. S. Chin, C. C. Yu, Y. D. Yao, and Y. Liou, J. Appl. Phys. 97, 10N121 (2005).
[110] J. S. Chen, T. J. Zhou, Y. F. Ding, B. C. Lim, and B. Liu, J. Appl. Phys. 97, 10N108 (2005).
[111] H. J. Kim and S. R. Lee J. Appl. Phys. 97, 10H304 (2005).
[112] C. P. Luo and D. J. Sellmyer, Appl. Phys. Lett. 75, 3162 (1999).
[113] C. P. Luo, Y. Liu, and D. J. Sellmyer, J. Appl. Phys, 87, 6941 (2000).
[114] T. Saito, O. Kitakami, and Y. Shimada, J. Magn. Magn. Mater. 239, 310 (2002).
[115] D. H. Wei, C. C. Yu, S. C. Chou, Y. D. Yao, Y. Liou, and T. S. Chin, phys. stat. sol. (b). 241, 1752 (2004).
[116] D. H. Wei, C. C. Yu, S. C. Chou, Y. D. Yao, Y. Liou, and T. S. Chin, phys. stat. sol. (a). 201, 3361 (2004).
[117] J. S. Chen, B. C. Lim, and J. P. Wang, Appl. Phys. Lett. 81, 1848 (2002).
[118] B. C. Lim, J. S. Chen, and J. P. Wang, J. Magn. Magn. Mater. 271, 159 (2004).
[119] J. S. Chen and J. P. Wang, J. Magn. Magn. Mater. 284, 423 (2004).
[120] J. S. Chen, B. C .Lim, and T. J. Zhou, J. Vac. Sci. Technol. A 23(1), 184 (2005).
[121] W. K. Shen, J. H. Judy, and J. P. Wang, J. Appl. Phys. 97, 10H301 (2005).
[122] M. L. Yan, H. Zeng, N. Powers, and D. J. Sellmyer, J. Appl. Phys. 91, 8471 (2002).
[123] Z. G. Zhang, K. Kang, and T. Suzuki, Appl. Phys. Lett. 83, 1785 (2003).
[124] S. Jeong, Y. N. Hsu, D. E. Laughlin, and M. E. McHenry, IEEE Trans. Magn. 36, 2336 (2000).
[125] K. Kang, Z. G. Zhang, C. Papusoi, and T. Suzuki, Appl. Phys. Lett. 84, 404 (2004).
[126] K. Kang, T. Suzuki, Z. G. Zhang, and C. Papusoi, J. Appl. Phys. 95, 7273 (2004).
[127] T. Suzuki, K. Harada, N. Honda, and K. Ouchi, J. Magn. Magn. Mater. 193, 85 (1999).
[128] T. Suzuki, N. Honda, and K. Ouchi, IEEE Trans. Magn. 35, 2748 (1999).
[129] T. Suzuki, T. Kiya, N. Honda, and K. Ouchi, IEEE Trans. Magn. 36, 2417 (2000).
[130] T. Suzuki, T. Kiya, N. Honda, and K. Ouchi, J. Magn. Magn. Mater. 235, 312 (2001).
[131] C. Byun, J. M. Sivertsen, and J. H. Judy, IEEE Trans. Magn. 22, 1155 (1986).
[132] P. L. Lu and S. H. Charap, IEEE Trans. Magn. 28, 986 (1992).
[133] S. Chikazumi, “Physics of Ferromagnetism”, Clarendon, Oxford, 1997, pp. 495.
[134] H. Stablein, “Ferro~Magnetic Materials (3): A handbook on the properties of magnetically ordered substances” edited by E. P. Wohlfarth, North Holland, 1982, pp. 560.
[135] T. Suzuki, N. Honda, and K. Ouchi, J. Appl. Phys. 85, 4301 (1999).
[136] A. Y. Cho, Appl. Phys. Lett. 19, 467 (1971).
[137] A. Y. Cho, J. Appl. Phys. 42, 2074 (1971).
[138] A. Y. Cho and F. K. Reinhart Appl. Phys. Lett. 21, 355 (1972).
[139] M. V. Schneider, R. A. Linke, and A. Y. Cho, Appl. Phys. Lett. 19, 467 (1977).
[140] http://www.las.inpe.br/~cesar/Infrared/rheed.htm/.
[141] R. H. Milne, “Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces” edited by P. K. Larsen and P. J. Dobson, 1988, pp. 139-174.
[142] C. C. Yu, PH. D dissertation, National Cheng-Kung University (2000).
[143] F. J. Himpsel, J. E. Ortega, G. J. Mankey, and R. F. Willis, Adv. Phys. 47, 511 (1998).
[144] B. M. Lairson, M. R. Visokay, R. Sinclair, and B. M. Clemens, Appl. Phys. Lett. 62, 639 (1993).
[145] M. R. Visokay and R. Sinclair, Appl. Phys. Lett. 66, 1692 (1995).
[146] M. H. Hong and K. Hono, and M. Watanabe, J. Appl. Phys. 84, 4403 (1998).
[147] Y. Ide, T. Goto, K. Kikuchi, K. Watanabe, J. Onagawa, H. Yoshida, and J. M. Cadogan, J. Magn. Magn. Mater. 171, 1245 (1998).
[148] T. Goto, Y. Ide, H. Abe, K. Watanabe, J. Onagawa, H. Yoshida, and J. M. Cadogan, J. Magn. Magn. Mater. 198, 486 (1999).
[149] M. G. Kim and S. C. Shin, J. Appl. Phys. 90, 2211 (2001).
[150] S. Ishio, N. Mori, T. Yoshino, H. Saito, T. Suzuki, and K. Ohuchi, J. Magn. Magn. Mater. 235, 148 (2001).
[151] L. Mei, D. Wachenschwanz, B. Bian, G. Bertero, L. He, and C. Chen, J. Magn. Magn. Mater. 239, 385 (2002).
[152] Y. Huang, H. Okumura, G. C. Hadjipanayis, and D. Weller, J. Magn. Magn. Mater. 242, 317 (2002).
[153] T. Yang, E. Ahmad, and T. Suzuki, J. Appl. Phys. 91, 6860 (2002).
[154] M. Weisheit, L. Schultz, and S. Fähler, J. Appl. Phys. 95, 7489 (2004).
[155] J.-U. Thiele, L. Folks, M. F. Toney, and D. K. Weller, J. Appl. Phys. 84, 5686 (1998).
[156] T. C. Hufnagel, M. C. Kautzky, B. J. Daniels, and B. M. Clemens, J. Appl. Phys. 85, 2609 (1999).
[157] T. Shima, K. Takanashi, Y. K. Takahashi and K. Hono, Appl. Phys. Lett. 81, 1050 (2002).
[158] T. Shima, K. Takanashi, Y. K. Takahashi, K. Hono, G. Q. Li, and S. Ishio, J. Magn. Magn. Mater. 266, 171 (2003).
[159] T. Shima, K. Takanashi, G. Q. Li, and S. Ishio, Materials Trans. 44 1508 (2003).
[160] T. Shima, K. Takanashi, Y. K. Takahashi and K. Hono, Appl. Phys. Lett. 85, 2571 (2004).
[161] J. A. Christodoulides, P. Faber, M. Daniil, H. Okmura, G. C. Hadjipanayis, V. Skumryev, A. Simopoulos, and D. Weller, IEEE Trans. Magn. 37, 1292 (2001).
[162] B. E. Warren, “X-ray Diffraction” (Dover, New York, 1990), pp. 208–210.
[163] B. D. Cullity and S. R. Stock, “Elements of X-ray Diffraction”, 3rd ed., Prentice Hall: Upper Saddle River 2001, pp. 167-171.
[164] G. Q. Li, H. Takahoshi, H. Ito, H. Saito, S. Ishio, T. Shima, and K. Takanashi, J. Appl. Phys. 94, 5672 (2003).
[165] S. Ishio, G. Q. Li, H. Takahoshi, H. Ito, H. Saito, T. Shima, and K. Takanashi, J. Magn. Magn. Mater. 272, 819 (2004).
[166] G. Q. Li, H. Takahoshi, H. Ito, T. Washiya, H. Saito, S. Ishio, T. Shima, and K. Takanashi, J. Magn. Magn. Mater. 287, 219 (2005).
[167] R. F. C. Farrow, D. Weller, R. F. Marks, M. F. Toney, D. J. Smith, and M. R. McCartney, J. Appl. Phys. 84, 934 (1998).
[168] D. H. Wei, C. C. Yu, H. M. Duh, Y. D. Yao, J. H. Chien, and T. S. Chin, J. Magn. Magn. Mater. 272, 370 (2004).
[169] T. Seki, T. Shima, and K. Takanashi, J. Magn. Magn. Mater. 272, 2182 (2004).
[170] T. Seki, T. Shima, K. Takanashi, Y. Takahashi, E. Matsubara, and K. Hono, IEEE Trans. Magn. 40, 2522 (2004).
[171] P. Shewmon, “Diffusion in Solids”, 2rd ed., 1989, pp. 84-94.
[172] P. F. Carcia, J. Appl. Phys. 63 5066 (1988).
[173] Y. Z. Zhou, J. S. Chen, G. M. Chow, and J. P. Wang, J. Appl. Phys. 93, 7577 (2003).
[174] J. Zou, B. Lu, T. Leonhardt, D. E. Laughlin, and D. N. Lambeth, J. Appl. Phys. 87 6869 (2000).
[175] F. T. Yuan, S. K. Chen, W. C. Chang, and Lance Horng, Appl. Phys. Lett. 85, 3163 (2004).
[176] S. K. Chen, F. T. Yuan, and T. S. Chin, J. Appl. Phys. 97, 073902 (2005).
[177] S. K. Chen, F. T. Yuan, and S. N. Shiao, IEEE Trans. Magn. 41, 921 (2005).
[178] D. H. Wei, S. C. Chou, T. S. Chin, C. C. Yu, Y. D. Yao, and Y. Liou, J. Appl. Phys. 97, 10N120 (2005).
[179] H. J. Richter, IEEE Trans. Magn. 29, 2258 (1993).
[180] Y. Y. Zou, J. P. Wang, C. H. Hee, and T. C. Chong, Appl. Phys. Lett. 82, 2473 (2003).
[181] J. P. Wang, W. K. Shen, J. M. Bai, R. H. Victora, J. H. Judy, and W. L. Song, Appl. Phys. Lett. 86,142504 (2005).
[182] X. Z. Cheng and M. B. A. Jalil, J. Appl. Phys. 97, 10E314 (2005).