研究生: |
林均容 Lin, Chun-Jung |
---|---|
論文名稱: |
N型二硫化鎢電晶體之介電層探討 The Investigation of Dielectric Layer for N-Type WS₂ FET |
指導教授: |
邱博文
Chiu, Po-Wen |
口試委員: |
闕郁倫
Chueh, Yu-Lun 李奎毅 Lee, Kuei-Yi |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 電子工程研究所 Institute of Electronics Engineering |
論文出版年: | 2024 |
畢業學年度: | 113 |
語文別: | 中文 |
論文頁數: | 98 |
中文關鍵詞: | 二維材料 、過渡金屬硫屬化物 、二硫化鎢 、介電層 、鈍化層 、表面處理 |
外文關鍵詞: | 2D materials, TMDCs, WS₂, Dielectric, Passivation, Surface treatment |
相關次數: | 點閱:40 下載:0 |
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本論文研究重點是在探討n型二硫化鎢(WS₂)電晶體的介電層。二硫化鎢是一種過渡金屬硫屬化物(TMDCs),因該材料具有優異的光學和電學性能,尤其是材料表面缺乏懸鍵對載子遷移率的影響,使其成為極具潛力的半導體材料。然而,二硫化鎢在大氣環境易受氧氣和水氣的影響,導致材料氧化或p型摻雜效應,使其電子傳輸特性下降,影響電晶體的性能。因此,本研究的目的是尋找一個穩定的介電層材料來保護通道材料,以提高二硫化鎢電晶體在大氣中的穩定性。
本研究詳細分析了不同介電材料的特性及成長方式,也探討了不同介電層對元件電性的影響,並成功以電漿輔助原子層沉積之氧化鉿作為介電層,加上熱蒸鍍鋁金屬後高壓氧化之氧化鋁,作為介電層前鈍化層,使n型二硫化鎢電晶體於大氣環境有效開關,且電晶體之電性表現與介電層製程前無明顯差異。該電晶體之開電流約為10⁻⁶A,關電流約為10⁻¹¹A,次臨界擺幅由約為1270mV/dec,臨界電壓約為4V,載子遷移率約為0.9cm²/V·s。
The focus of this thesis is on investigating the dielectric layer of n-type tungsten disulfide (WS₂) transistors. Tungsten disulfide, a type of transition metal dichalcogenide (TMDC), has excellent optical and electrical properties. One of its key advantages is the absence of dangling bonds on the material’s surface, which improves the carrier mobility of the material, making it a promising semiconductor material. However, WS₂ is susceptible to oxidation or p-type doping effects due to exposure to oxygen and moisture in the atmosphere, which degrades its electronic transport properties and affects transistor performance. Therefore, the goal of this study is to identify a stable dielectric material to protect the channel material and improve the stability of WS₂ transistors in ambient conditions.
This study analyzes the properties of different dielectric materials and their deposition methods, and it also explores the impact of different dielectric layers on device performance. The study successfully utilized plasma-enhanced atomic layer deposition (PEALD) of hafnium oxide as the dielectric layer, combined with thermally evaporated aluminum followed by high-pressure oxidation to form aluminum oxide, serving as a passivation layer for the dielectric layer. This approach allowed the n-type tungsten disulfide transistors to effectively switch in atmospheric conditions, with its electrical performance showing no significant difference compared to before dielectric layer processing. The device exhibited an on-current of approximately 10⁻⁶A, an off-current of approximately 10⁻¹¹A, a subthreshold swing of about 1270 mV/dec, a threshold voltage of around 4 V, and a carrier mobility of approximately 0.9 cm²/V·s.
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