研究生: |
劉守恩 Shou-En Liu |
---|---|
論文名稱: |
非對稱型雙閘極電晶體的臨界電壓模型 Threshold Voltage Model of Asymmetry Double Gate MOSFET |
指導教授: |
連振炘
Chen-Hsin Lien |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
電機資訊學院 - 電子工程研究所 Institute of Electronics Engineering |
論文出版年: | 2006 |
畢業學年度: | 94 |
語文別: | 中文 |
論文頁數: | 61 |
中文關鍵詞: | 非對稱型雙閘極電晶體 、臨界電壓 、量子侷限效應 |
相關次數: | 點閱:2 下載:0 |
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由於非對稱型雙閘極電晶體的臨界電壓模型仍未完善,除了定義上有待修正以外,目前為止被提出的模型並未考慮到因維度縮小導致的量子效應問題。本論文中,將運用半導體物理之計算與MEDICI模擬軟體討論前非對稱型雙閘極臨界電壓模型的恰當性與量子效應造成的影響,將模型修正項以一半導體厚度與絕緣層厚度的參數表示,再輔以模擬軟體驗證之,以期能得到一易於使用的臨界電壓模型。與此則元件設計者將易於估算元件設計時所需要的元件參數。
參考文獻
References
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