研究生: |
林倍均 Lin, Bei-Jyun |
---|---|
論文名稱: |
高可靠度產品之擇優研究 (以逆高斯衰變模型為實例) Selecting the Most Reliable Design of Highly Reliable Products |
指導教授: | 曾勝滄 |
口試委員: |
樊采虹
彭健育 湯銀才 |
學位類別: |
碩士 Master |
系所名稱: |
理學院 - 統計學研究所 Institute of Statistics |
論文出版年: | 2014 |
畢業學年度: | 102 |
語文別: | 中文 |
論文頁數: | 43 |
中文關鍵詞: | 衰變模型 、逆高斯衰變模型 、局部最佳挑選法則 |
外文關鍵詞: | Degradation Model, Inverse Gaussian Degradation Model, Locally Optimal Selection Rule |
相關次數: | 點閱:3 下載:0 |
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產品可靠度 (reliability) 是決定消費者挑選產品之重要影響因素,因此如何從眾多供應商中,建構適當的擇優挑選法則 (selection rule) 來挑選出具有能生產高可靠度產品能力之最佳供應商是生產者經常面臨之重要決策問題。 本研究在假設供應商之產品衰變路徑服從逆高斯衰變模型,探討如何建構適當之擇優法則及規畫衰變試驗之最適實驗配置 (包括測試樣本、觀測頻率及終止時間) 之決定。 具體而言,在確保可正確挑選出最佳供應商之機率達到給定的 P^* 及做錯誤決策機率要小於 α^* 下,決定可使得實驗總成本極小化之最適配置。 最後並舉例說明如何使用本文所建構之挑選法則;與傳統的挑選法則相比較,可發現本研究所建構的挑選法則之最大優點是可以有效地降低實驗所需的樣本數及總實驗時間。
At the research and development (R & D) stage, the manufacturers may wish to select the most reliable product (supplier) from among several competing products (suppliers). In this study, assuming the degradation paths of product’s quality characteristics come from an inverse Gaussian degradation process, we first apply locally optimal (LO) criterion to construct a suitable selection rule. Furthermore, with a minimum guarantee of probability of correct selection (CS) of the proposed rule, we deal with the optimal design of a degradation experiment (which includes the determinations of the sample size, sampling frequency and the termination time) in such a way that the total experimental cost can be minimized. Finally, we use an example to demonstrate the proposed procedure. From the results, it shows that our proposed procedure has the ability of substantially reducing the sample size and termination time, which are needed to conduct a degradation experiment.
[1] Abdel-Hameed, M. (1975), “A gamma wear process,” IEEE Transactions on Reliability, 24(2), 152-153.
[2] Basu, A. K. and Wasan, M. T. (1974), “On the first passage time processes of Brownian motion with positive drift,” Scandinavian Actuarial Journal, 1974(3), 144-150.
[3] Berman, M. (1981), “Inhomogeneous and modulated gamma process,” Biometrika, 68(1), 143-152.
[4] Chhikara, R. S. and Folks, L. (1989), The Inverse Gaussian Distribution Theory, Methodology, and Applications, Marcel Dekker, Inc.
[5] Doksum, K. A. and Hóyland, A. (1992), “Model for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution,” Technometrics, 34(1), 74-82.
[6] Huang, D. Y., Panchapakesan, S. and Tseng, S. T. (1984), “Some locally optimal subset selection rules for comparison with a control,” Journal of statistical planning and inference, 9(1), 63-72.
[7] Lawless, J. F. (2002), Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York.
[8] Lu, J. C. and Meeker, W. Q. (1993), “Using degradation measures to estimate a time- to-failure distribution,” Technometrics, 35(2), 161-174.
[9] Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, New York: John Wiley & Sons.
[10] Nelson, W. (1990), Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley & Sons, New York.
[11] Park, C. and Padgett, W. J. (2005), “Accelerated degradation models for failure based on geometric Brownian motion and gamma process,” Lifetime Data Analysis, 11(4), 511-527.
[12] Park, C. and Padgett, W. J. (2006), “Stochastic degradation models with several accelerating variables,” IEEE Transactions on Reliability, 55(2), 379-390.
[13] Singpurwalla, N. D. (1995), “Survival in dynamic environments,” Statistical Science, 10(1), 86-103.
[14] Tsai, C. C., and Lin, C. T. (2014). Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes. Communications in Statistics-Theory and Methods, 43(10-12), 2419-2428.
[15] Tsai, C. C., Tseng, S. T. and Balakrishnan, N. (2011), “Optimal burn-in for highly reliable products using gamma degradation process,” IEEE Transactions on Reliability, 60(1), 234-245.
[16] Tseng, S. T. (1994), “Planning accelerated life tests for selecting the most reliable product,” Journal of statistical planning and inference, 41(2), 215-230.
[17] Tseng, S. T., Hamada, M. and Chiao, C. H. (1995), “Using degradation data to improve fluorescent lamp reliability,” Journal of Quality Technology, 27(4), 363-369.
[18] Tseng, S. T., Tang, J. and Ku, I. H. (2003), “Determination of burn-in parameters and residual life for highly reliable products,” Naval Research Logistics, 50(1), 1-14.
[19] Wang, X. and Xu, D. (2010), “An inverse Gaussian process model for degradation data,” Technometrics, 52(2), 188-197.
[20] Yu, H. F. and Tseng, S. T. (1999), “Designing a degradation experiment,” Naval Research Logistics, 46(6), 689-706.
[21] Yu, H. F. and Tseng, S. T. (2002), “Designing a screening experiment for highly reliable products,” Naval Research Logistics, 49(5), 514-526.
[22] Yu, H. F. (2003), “Optimal selection of the most reliable design whose degradation path satisfies a Wiener process,” International Journal of Quality & Reliability Management, 20(9), 1084-1095.
[23] Yang, G. (2007), Life cycle reliability engineering, John Wiley & Sons.