從視光學而言，矯正視力以框架眼鏡及隱形眼鏡為主要方式，而軟式隱形眼鏡因配戴之方便及舒適性而被廣泛使用。從視光學分析來看，軟式隱形鏡片因具彈性，在配戴時因與角膜貼合而造成鏡片變形，使屈光性能改變。因此在配戴軟式隱形眼鏡時，或因眼球之角膜形狀差異，故有不同之矯正效果。本論文從設計具有角膜曲率之載具出發，並以光學分析軟體模擬鏡片在眼球之光學性能，從實驗光學性能量測驗證之。
在光學設計學理中，三階像差及高階像差會使得人視覺上產生模糊、扭曲等成像品質問題，故本論文以夏克-哈特曼波前感測器為感測元件，分別以傳統隱形眼鏡載具及具有角膜曲率之創新設計載具，建立隱形鏡片量測系統能力，進行鏡片度數及波前像差之量測實驗，並以光學分析軟體及波前分析軟體，分別進行系統光路模擬及系統波前像差分析，再由量測市售軟式隱形鏡片進行驗證實驗，討論各系統之可靠度及方便性。經實驗結果比較分析後，確認傳統載具量測系統之準確性，而角膜載具系統會因球差影響度數量測結果。而像差分析則以球差為主進行分析，結果顯示在不同載具下，隱形鏡片之像差亦不同。具角膜曲率之量測載具可分析鏡片配戴於人眼之性能，確認角膜曲率載具之應用可行性。

In optometry, spectacles and contact lenses are primary methods in vision correction; and, soft contact lenses have been widely used because of the convenience and comfort. Due to the flexibility in lens materials leading to lens deformation fitted on cornea, the optical performance of contact lenses may change after being worn on eyes with uneven cornea tomography. Therefore this thesis studies and designs a test jig for contact lens fitted with corneal shape; and, the test jig can emulate contact lenses fitted on the cornea with measured optical performance for verifications of the optical analysis.
In optics design and analysis, the third-order and higher aberrations would lead to distortion and blur in vision; hence, this thesis build a contact lens measurement system with a Shark-Hartmann wavefront sensor; and, the system can measure the aberrations and back vertex power of contact lens fitted on the test jig. In addition, the results of conventional wet-cell system are compared with the results of in-house built system. The accuracy of wet cell system is confirmed; while due to the cornea tomography variation induced spherical aberration, the back vertex power has more error from the test jig measurement. Since spherical aberration is prominent in fitting of contact lenses, both the simulations and experimental results show the spherical aberration of contact lens fitted on cornea surface is significant which is similar to the condition of lenses on the eyes. The results confirm the feasibility and potential of application of the test jig in the future.

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