研究生: |
謝鎮陽 Cheng-Yang Hsieh |
---|---|
論文名稱: |
銲點之X-ray 斷層顯像技術中殘影效應之分析 Shadowing Effect of X-ray Laminography in Solder Joint Inspection |
指導教授: |
彭明輝
Ming-Hwei Perng |
口試委員: | |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 動力機械工程學系 Department of Power Mechanical Engineering |
論文出版年: | 2008 |
畢業學年度: | 96 |
語文別: | 中文 |
論文頁數: | 98 |
中文關鍵詞: | X射線層析攝影合成 、殘影效應 、自動光學檢測 |
外文關鍵詞: | X-ray computed tomosynthesis, shadowing effect, Automated Optical Inspection |
相關次數: | 點閱:2 下載:0 |
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傳統層析X射線攝影合成(X-ray computed tomosynthesis)應用於工業檢測下所建立之剖面影像因殘影效應(shadowing effect)的發生,無法準確判斷瑕疵或真實材料的邊界所在位置。
過去對殘影效應之認知主要建立在實驗影像或模擬影像的定性觀察,本研究推導殘影效應之影響範圍公式,首先探討單一薄板之殘影效應,並建立殘影效應之等效模型,由公式面驗證過去實驗觀察而知的特性;接著利用單層薄板之結論,推廣至連續體軸對稱材料(圓球)狀之殘影效應分析,將球體內外任意點殘影效應之厚度公式化,並比較所推導之公式與實際模擬影像殘影厚度之差距,以修正其誤差。
本研究亦將利用所推導之厚度公式,發展一方法以偵測瑕疵與真實材料所在位置之上下界,以解決過去無法從X射線剖面影像檢測中直接推估元件或瑕疵所在位置之問題。
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