研究生: |
李軒毅 Lee, Syuan-Yi |
---|---|
論文名稱: |
自適應虛擬樣本生成機制於概念飄移小樣本資料集之應用 Self-Adaptive Virtual Sample Generation Mechanism in Concept Drift with Small Sample Size |
指導教授: |
陳建良
Chen, James C. |
口試委員: |
陳子立
Chen, Tzu-Li 陳盈彥 Chen, Yin-Yann |
學位類別: |
碩士 Master |
系所名稱: |
工學院 - 工業工程與工程管理學系 Department of Industrial Engineering and Engineering Management |
論文出版年: | 2024 |
畢業學年度: | 112 |
語文別: | 中文 |
論文頁數: | 54 |
中文關鍵詞: | 概念飄移 、小樣本資料集 、虛擬樣本生成 、即時學習 、工業 4.0 |
外文關鍵詞: | Concept Drift, Small Sample Size, Virtual Sample Generation (VSG), Just-In-Time Learning (JITL), Industry 4.0 |
相關次數: | 點閱:53 下載:0 |
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當前製造業領域中,為了有效應對漸趨複雜的市場需求,生產過程正向著工業4.0與永續製造的實踐方向轉變。這些變革包含了更小批次的產品客製化與更具堅韌性的供應鏈需求等,也顯著縮短了產品生命週期和製造週期。於此時代趨勢下,大數據和分析技術在提高生產力、靈活性和資源效率方面變得愈加重要,並在預測性維護、快速生產系統重組、減少浪費和能源消耗以及資源分配優化中發揮關鍵作用。然而,實施這些技術面臨著數據流中的概念漂移和小樣本學習的挑戰。
概念漂移發生在資料集中的共變量偏移導致無法準確解釋目標集的變異性時;小樣本學習則會導致過擬合和高變異性等問題。在製造現場中,受限於抽樣成本與時間,「大數據,小樣本」已成常態,而當訓練集中的樣本數量有限時,演算法可能會輸出帶有偏差的預測結果。
因此,本研究旨在開發一種自適應的預測模型框架,以同時應對概念漂移和小樣本學習的挑戰為目標,通過採用即時學習(Just-In-Time Learning, JITL)來確保模型性能的維持和恢復,並利用虛擬樣本生成(Virtual Sample Generation, VSG)來減輕與小樣本學習相關的高變異與過擬合問題,最後將以上框架結合超參數最佳化的自適應框架,達到穩定的預測結果。從實驗結果表明,採用本研究提出之SAJITL和SAVSG可以顯著提高常見的模型性能,如 Linear Regression、XGBoost 與 Extreme Learning Machine (ELM)。此外,本研究提出的框架可以彈性整合進其他時間序列或虛擬樣本生成技術,並與先進的預測模型協調運作,以進一步提升在概念漂移和小樣本規模限制下的模型性能。
Modern manufacturing is moving towards Industry 4.0 and sustainable practices to meet complex market demands. This shift involves smaller batch sizes, more resilient supply chains, and shorter product and manufacturing cycles. In this context, big data and analytics are crucial for boosting productivity, flexibility, and resource efficiency, playing key roles in predictive maintenance, system reconfiguration, waste reduction, and resource optimization. However, implementing these technologies faces challenges like concept drift and small sample size learning in data streams.
Concept drift occurs when dataset covariates shift, reducing explanatory power for target variability. Small sample size learning leads to overfitting and high variance. In manufacturing, due to high sampling costs and time constraints, "big data, small sample" is common, often resulting in biased predictions.
This study develops a novel prediction framework to tackle concept drift and small sample size learning concurrently. By adopting Just-In-Time Learning (JITL), model performance is maintained and recovered, while Virtual Sample Generation (VSG) reduces high variance and overfitting issues. Lastly, the framework integrates these methods with hyperparameter optimization for adaptive and stable results. Experiments show that the proposed SAJITL and SAVSG methods significantly improve the performance of common models, such as Linear Regression, XGBoost and Extreme Learning Machine (ELM). In addition, the proposed framework can seamlessly combine with other time-series and virtual sample generation techniques as demonstrated in this research , and be coordinated with advanced prediction algorithms to further enhance model performance under the constraints of concept drift and small sample size.
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