本論文利用常見之標準SiGe BiCMOS製程設計一Full HD(1920x1080)影像陣列的影像感測器，期望能夠同時達到高動態範圍與30frame/s的規格。
因為1920x1080陣列走線阻值和寄生電容之數量級很可能影響訊號的傳遞，在讀出電路和數位訊號控制電路的設計上必須詳加考量。第四章將會針對整個影像感測器電路各區塊做逐步設計，並點出需詳加考量走線阻值和寄生電容的部分。期望這些經驗有助於往後設計出更接近商品規格的影像感測器。
動態範圍上，本論文使用的SiGe BC接面二極體具有極佳的靈敏度，在大範圍光強度下可以產生大範圍的光電流。為了處理大範圍的電流訊號，巧妙的利用SiGe BiCMOS製程中可順偏操作的二極體來做對數轉換，故影像感測器可獲得高動態偵測範圍至少132.7 dB(光電流範圍為10 pA~43 uA)，且在低照度的感測靈敏度可到0.01 lux。

[1] M. Bigas, E. Cabruja, J. Forest, J. Salvi, “Review of CMOS image sensors”, Microelectronics Journal 37 (2006) 433–451.
[2] Abbas El Gamal and Helmy Eltoukhy, “CMOS IMAGE SENSORS”, IEEE Circuits Devices Mag., pp. 6-20, May June 2005.
[3] Eric R. Fossum, “CMOS Image Sensors: Electronic Camera On A Chip”, IEEE Trans. Electron Devices, VOL. 44, NO. 10, pp. 1689-1698, OCTOBER 1997.
[4] Tsung-Hsun Tsi, “A Pixel Circuit Research on High Dynamic Range CMOS Image Sensor”, MS. Thesis, Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, June 2007.
[5] Shu-Cheng Liu, “Study on Parameters Extraction Method of CMOS Image Sensor”, NTHU, MS. Thesis, Institute of Electronic Engineering, Hsinchu, Taiwan, June 2005.
[6] Hsiu-Yu Cheng and Ta-Chin King, “A CMOS Image Sensor With Dark-Current
Cancellation and Dynamic Sensitivity Operations” , IEEE Trans. Electron Devices, vol.50,no.1, pp. 91-95, January 2003.
[7] Liang-Wei Lai, Cheng-Hsiao Lai, and Ya-Chin King, “A Novel Logarithmic
Response CMOS Image Sensor With High Output Voltage Swing and In-Pixel
Fixed-Pattern Noise Reduction”, IEEE Sensors J., Vol. 4, No.1, pp. 122-126,
February 2004.
[8] Satoshi Yoshihara, Yoshikazu Nitta, Masaru Kikuchi, Ken Koseki, Yoshiharu Ito,
Yoshiaki Inada, Souichiro Kuramochi, Hayato Wakabayashi, Masafumi Okano,
Hiromi Kuriyama, Junichi Inutsuka, Akari Tajima, Tadashi Nakajima, Yoshiharu
Kudoh, Fumihiko Koga, Yasuo Kasagi, Shinya Watanabe, and Tetsuo Nomoto,
“A 1/1.8-inch 6.4 MPixel 60 frames/s CMOS Image Sensor With Seamless Mode Change”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 41, NO. 12, pp. 2998-3006, DECEMBER 2006.
[9] Eric R. Fossum, “CMOS Image Sensors:Electronic Camera-On-A-Chip” , IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 44, NO. 10, pp. 1689-1698, OCTOBER 1997.
[10] Stuart Kleinfelder, SukHwan Lim, Xinqiao Liu, and Abbas El Gamal,
“A 10000 Frames/s CMOS Digital Pixel Sensor”, IEEE JOURNAL OF
SOLID-STATE CIRCUITS, VOL. 36, NO. 12, pp. 2049-2059, DECEMBER 2001.
[11] Jun-Myung Woo, Hong-Hyun Park, Sung-Min Hong, In-Young Chung, Hong Shick Min, and Young June Park, “Statistical Noise Analysis of CMOS Image Sensors in Dark Condition”, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 56, NO. 11, pp. 2481-2488, NOVEMBER 2009.
[12] Sunetra K. Mendis, Sabrina E. Kemeny, Russell C. Gee, Bedabrata Pain, Craig O. Staller, Quiesup Kim, and Eric R. Fossum, “CMOS Active Pixel Image Sensors for Highly Integrated Imaging Systems”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 32, NO. 2, pp. 187-197, FEBRUARY 1997.
[13] Martijn F. Snoeij, Albert J. P. Theuwissen, Kofi A. A. Makinwa, and Johan H. Huijsing, “A CMOS Imager With Column-Level ADC Using Dynamic Column Fixed-Pattern Noise Reduction”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 41, NO. 12, pp. 3007-3015, DECEMBER 2006.
[14] Andrew J. Blanksby, and Marc J. Loinaz, “Performance Analysis of a Color CMOS Photogate Image Sensor”, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 47, NO. 1, pp. 55-64, JANUARY 2000.
[15] Hidekazu Takahashi, Tomoyuki Noda, Takashi Matsuda, Takanori Watanabe, Mahito Shinohara, Toshiaki Endo, Shunsuke Takimoto, Ryuichi Mishima, Shigeru Nishimura, Katsuhito Sakurai, Hiroshi Yuzurihara, and Shunsuke Inoue, “A 1/2.7-in 2.96 MPixel CMOS Image Sensor With Double CDS Architecture for Full High-Definition Camcorders”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 42, NO. 12, pp. 2960-2967, DECEMBER 2007.
[16] 黃吉成,“應用於0.35 μm SiGe BiCMOS 高速光電積體電路之設計技巧＂, 國立清華大學, 電子工程研究所, 博士論文, 中華民國九十八年七月.
[17] Shih-Chii Liu, Jorg Kramer, Giacomo Indiveri, Tobias Delbuck, and Rodney Douglas, “Analog VLSI: Circuits and Principles”, Massachusetts Institute of Technology, 2002.
[18] 雷良煥,“新型低照度與高動態範圍之影像感測器陣列電路設計＂, 國立清華大學, 電子工程研究所, 碩士論文, 中華民國九十九年七月.
[19] Behzad Razavi, “Design of Analog CMOS Integrated Circuit”, McGraw-Hill, 2001.
[20] Khaled Salama and Abbas El Gamal, “Analysis of Active Pixel Sensor Readout Circuit”, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: FUNDAMENTAL THEORY AND APPLICATIONS, VOL. 50, NO. 7, pp. 941-945, JULY 2003.
[21] Nobuhiro Kawai, and Shoji Kawahito, “Noise Analysis of High-Gain, Low-Noise Column Readout Circuits for CMOS Image Sensors”, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 51, NO. 2, pp. 185-194, FEBRUARY 2004.
[22] S. Kawahito, “Signal Processing Architectures for Low-Noise High-Resolution CMOS Image Sensors”, IEEE 2007 Custom Intergrated Circuits Conference, pp. 695-702.
[23]Philip E. Allen, Douglas R. Holberg, “CMOS ANALOG CIRCUIT DESIGN”, Oxford University Press, 2010.
[24] “Noise” in Design of Analog CMOS Integrated Circuits, Behzad Razavi, 1st New York,USA: McGraw-Hill, 2001, ch.7 pp. 215-218, ch.11 pp. 377-381, ch.12 pp. 410-423.
[25] Weste N.H.E., Harris D, “CMOS VLSI design”, Pearson, 2005.
[26] Victor Adler, and Eby G. Friedman, “Repeater Design to Reduce Delay and Power in Resistive Interconnect”, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 45, NO. 5, pp. 607-616, MAY 1998.
[27] Ankireddy Nalarnalpu Wayne Burleson, “Repeater Insertion in deep sub-micron CMOS: Ramp-based Analytical Model and Placement Sensitivity Analysis”, ISCAS 2000 - IEEE International Symposium on Circuits and Systems, VOL. 3, pp. 766-769, May 28-31, 2000, Geneva, Switzerland.
[28] Seunghyun Lim, Jimin Cheon, Youngcheol Chae, Wunki Jung, Dong-Hun Lee, Minho Kwon, Kwisung Yoo, Seogheon Ham, and Gunhee Han, “A 240-frames/s 2.1-Mpixel CMOS Image Sensor With Column-Shared Cyclic ADCs”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 46, NO. 9, pp. 2073-2083, SEPTEMBER 2011.
[29] Isao Takayanagi, Miho Shirakawa, Koji Mitani, Masayuki Sugawara, Steinar Iversen, Jørgen Moholt, Junichi Nakamura, and Eric R. Fossum, “A 1.25-inch 60fps 8.3-M-Pixel Digital-Output CMOS Image Sensor”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 40, NO. 11, pp. 2305-2314, NOVEMBER 2005.
[30] Satoshi Yoshihara, Masaru Kikuchi, Yoshiharu Ito, Yoshiaki Inada,
Souichiro Kuramochi, Hayato Wakabayashi, Masafumi Okan, Ken Koseki, Hiromi Kuriyama, Junichi Inutsuka, Akari Tajima, Tadashi Nakajima, Yoshiharu Kudoh, Fumihiko Koga, Yasuo Kasagi, Shinya Watanabe, Tetsuo Nomoto, “A 1/1.8-inch 6.4MPixel 60 frames/s CMOS Image Sensor with Seamless Mode Change”, ISSCC 2006, pp. 1984-1993.
[31] Yoshikazu Nitta, Yoshinori Muramatsu, Kiyotaka Amano, Takayuki Toyama, JunYamamoto, Koji Mishina, Atsushi Suzuki, Tadayuki Taura, Akihiko Kato, Masaru Kikuchi, Yukihiro Yasui, Hideo Nomura, Noriyuki Fukushima, “High-Speed Digital Double Sampling with Analog CDS on Column Parallel ADC Architecture for Low-Noise Active Pixel Sensor”, ISSCC 2006, pp. 2024-2031.
[32] Hidekazu Takahashi, Tomoyuki Noda, Takashi Matsuda, Takanori Watanabe, Mahito Shinohara, Toshiaki Endo, Shunsuke Takimoto, Ryuuichi Mishima, Shigeru Nishimura, Katuhito Sakurai, Hiroshi Yuzurihara, Shunsuke Inoue, “A 1/2.7 inch Low-Noise CMOS Image Sensor for Full HD Camcorders”, ISSCC 2007 , pp. 510-618.
[33] Peter Centen, Steffen Lehr, Volker Neiss, Sabine Roth, Jeroen Rotte,
Heinrich Schemmann, Michael Schreiber, Patrick Vogel, Boon-Keng Teng,
Klaas Damstra, “A 2/3 inch CMOS Image Sensor for HDTV Applications with Multiple High-DR Modes and Flexible Scanning”, ISSCC 2007 , pp. 512-619.
[34] Masanori Furuta, Yukinari Nishikawa, Toru Inoue, and Shoji Kawahito, “A High-Speed, High-Sensitivity Digital CMOS Image Sensor With a Global Shutter and 12-bit Column-Parallel Cyclic A/D Converters”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 42, NO. 4, pp. 766-774, APRIL 2007.
[35] Shinichiro Matsuo, Timothy J. Bales, Masahiro Shoda, Shinji Osawa, Katsuyuki Kawamura, Anders Andersson, Munirul Haque, Hidenari Honda, Bryan Almond, Yaowu Mo, Jeffrey Gleason, Tony Chow, and Isao Takayanagi, “8.9-Megapixel Video Image Sensor With 14-b Column-Parallel SA-ADC”, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 56, NO. 11, pp. 2380-2389, NOVEMBER 2009.
[36] Jong-Ho Park, Satoshi Aoyama, Takashi Watanabe, Keigo Isobe, and Shoji Kawahito, “A High-Speed Low-Noise CMOS Image Sensor With 13-b Column-Parallel Single-Ended Cyclic ADCs”, IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 56, NO. 11, pp. 2414-2422, NOVEMBER 2009.
[37] Hayato Wakabayashi, Keiji Yamaguchi, Masafumi Okano, Souichiro Kuramochi, Oichi Kumagai, Seijiro Sakane, Masamichi Ito, Masahiro Hatano, Masaru Kikuchi, Yuuki Yamagata, Takeshi Shikanai, Ken Koseki, Keiji Mabuchi, Yasushi Maruyama, Kentaro Akiyama, Eiji Miyata, Tomoyuki Honda, Masanori Ohashi, Tetsuo Nomoto, “A 1/2.3-inch 10.3Mpixel 50frame/s Back-Illuminated CMOS Image Sensor”, ISSCC 2010, pp. 410-411.
[38] Youngcheol Chae, Jimin Cheon, Seunghyun Lim, Minho Kwon, Kwisung Yoo, Wunki Jung, Dong-Hun Lee, Seogheon Ham, and Gunhee Han, “A 2.1 M Pixels, 120 Frame/s CMOS Image Sensor With Column-Parallel ΔΣ ADC Architecture”, IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 46, NO. 1, pp. 236-247, JANUARY 2011.