在光學元件的製造過程中，必須用光學量測儀器來檢驗及驗證光學特性，非接觸式的光學量測技術多以干涉儀做為量測平台，干涉儀不但需要較多的光學元件，且對量測環境的敏感度高，花費價格也高。本文使用夏克-哈特曼波前感測器做為波前量測儀器，由拼接波前的方式來量測光學元件的特性，夏克-哈特曼波前感測器是由陣列透鏡分割波前後，利用光點的位置差異來重建波前，因此量測系統不需要複雜的分光及干涉讀取裝置就具有高精度。本文分成兩個部分進行波前拼接量測的系統設計，第一部分進行數值分析，找出適合作為波前量測的演算法以及拼接參數，同時也模擬拼接量測系統理想上的量測精度。第二部分設計一波前拼接量測系統，使用光學模擬軟體分析波前析拼接量測系統的誤差大小，並實際架設此量測系統進行實驗。最後此系統的波前量測結果與Zygo干涉儀量測結果比較得到波前誤差的RMS約為1/30波長。

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