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研究生: 仇德軒
Chiou, De-Shiuan
論文名稱: Performance and Power Optimization for Power Gating Designs
針對功率閘控制設計之效能及功率最佳化
指導教授: 張世杰
Chang, Shih-Chieh
口試委員:
學位類別: 博士
Doctor
系所名稱: 電機資訊學院 - 資訊工程學系
Computer Science
論文出版年: 2009
畢業學年度: 98
語文別: 英文
論文頁數: 74
中文關鍵詞: 功率閘漏電功率睡眠電晶體網路
外文關鍵詞: power gating, leakage power, DSTN
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  • 功率閘控已經成為降低漏電功率的最有效的方法之一。早先被提出的分散式睡眠電晶體網路(Distributed Sleep Transistor Network, DSTN),藉由串接虛擬接地線來最小化流過睡眠電晶體的瞬時最大電流(Maximum Instantaneous Current, MIC)。在這篇論文裡,我們提出了決定睡眠電晶體大小的方法來最小化漏電功率。
    首先,我們提出了一個時間複雜度為O(nlgn)的演算法,來有效估計睡眠電晶體兩端的壓降的上限值。我們的方法並考慮到不同邏輯叢集間放電電流的關連性,藉此避免了過份悲觀的壓降估計。第二,我們把單一一個時脈週期細分為多個時間單元,來觀察瞬時最大電流、壓降、和睡眠電晶體網路三者間的關連性。藉由這層關係,我們針對DSTN架構,提出了縮小睡眠電晶體總面積的演算法。有鑑於在功率閘設計中,常會加上去耦合電容來減少壓降等雜訊,因此我們決定睡眠電晶體大小的方法同時也考慮到了去耦合電容的效應。而針對我們方法的收斂性,我也提出了嚴謹的證明。


    Power gating is one of the most effective ways to reduce leakage power. Previously, a Distributed Sleep Transistor Network (DSTN) was proposed to reduce the sleep transistor area for power gating by connecting all the virtual ground lines together to minimize the Maximum Instantaneous Current flowing through sleep transistors. In this thesis, we propose two sleep transistor sizing methodologies for leakage power minimization. First, we present an O(n lg n)-time algorithm for efficiently estimating a tight upper bound of the voltage drop across sleep transistors in DSTN structure. Our algorithm takes the correlation between discharge current of different logic clusters into consideration, which avoids over-pessimistic voltage drop estimation. Secondly, we introduce a new relationship among Maximum Instantaneous Current, IR drops and sleep transistor networks from a temporal viewpoint. Based on this relationship, we propose an algorithm to reduce the total sizes of sleep transistors in DSTN designs. In our sizing method, the effect of decoupling capacitances is also taken into account since decaps are commonly inserted in a power gating design to reduce the IR drop noise. Also, the convergence of our sizing algorithm is guaranteed through the theorem we proposed.

    Content Abstract 2 Content 3 List of Figures 5 List of Tables 7 Chapter 1 Introduction 8 1.1 Leakage Power Challenge 8 1.2 Organization 10 1.2.1 Sleep Transistor Sizing Considering Charge Balancing 10 1.2.2 Sleep Transistor Sizing Considering Temporal Correlation 13 Chapter 2 Sleep Transistor Sizing Considering Charge Balancing 17 2.1 Relation between Voltage Drop and Timing Performance 17 2.2 Sleep Transistor Sizing Mechanism 18 2.3 Fast and Accurate Voltage Drop Estimation 20 2.3.1 Modeling of the DSTN Structure 20 2.3.2 Calculate IST Using Discharging Matrix 20 2.3.3 General Form of Discharging Matrix 21 2.3.4 Calculations of Discharging Matrix Ψ 22 2.3.5 Problem Formulation 24 2.3.6 Fast and Accurate MIC(STi) Estimation 27 2.4 Numerical Example of the Constrained LP Problem 29 2.5 Proof of Theorem 1 30 2.6 Sleep Transistor Sizing for the DSTN Structure 35 2.7 Proof of Theorem 2 37 2.8 Experimental Results 40 2.9 Summary 41 Chapter 3 Sleep Transistor Sizing Considering Temporal Correlation 42 3.1 Physical Implementation of DSTN 42 3.2 Relation between Size and MIC of a Sleep Transistor 44 3.3 Resistor Network Modeling of DSTN 45 3.4 Discharging Matrix Ψ 47 3.5 MIC Estimation Using Time-Frame Partitioning 49 3.6 Variable-Length Time-Frame Partitioning 52 3.7 Considering Decoupling Capacitance 56 3.8 Problem Formulation of Sleep Transistor Sizing 59 3.9 Sleep Transistor Sizing Algorithm 60 3.10 Experimental Results 65 3.11 Summary 69 Chapter 4 Conclusion 70 References 71 List of Figures Figure 1 1: Leakage power of a single inverter increases exponentially with technology scaling. (from [6]) 8 Figure 1 2: Illustration of MTCMOS circuit scheme.. 10 Figure 1 3(a): Cluster-based: each cluster is connected to one sleep transistor. 11 Figure 1 3(b): DSTN: all the virtual grounds are connected together.. 11 Figure 1 4: Power gating scheme.. 13 Figure 1 5: The MIC waveforms of two clusters.. 15 Figure 2 1: Resistance network modeling for DSTN.. 20 Figure 2 2: A resistance network of a DSTN design with n = 3.. 22 Figure 2 3(a): From node 1 to node 2 23 Figure 2 3(b): From node 3 to node 2 23 Figure 2 3(c): From C2 to node 2 24 Figure 2 4: Different combinations of clusters’ MIC information 26 Figure 2 5: A Linear Programming problem to estimate MIC(ST3) 26 Figure 2 6: A balanced full binary tree to depict the correlation-constraints insertion rule for the design with 4 clusters 27 Figure 2 7: The exact algorithm solving the maximization problem under MIC constraints 28 Figure 2 8: A numerical example of MIC(STi) estimation 29 Figure 2 9: The constraint tree for the CTM problem in Figure 2-8 31 Figure 2 10: Another example with two unsaturated path A→B2→C3 and A→B2→C4 32 Figure 2 11: Subtract ICw and add ICs by q will improve the solution 33 Figure 2 12: Sleep transistor sizing algorithm 36 Figure 2 13(a): A general conductance network for STj and CSi 38 Figure 2 13(b): A general conductance network for CSi 38 Figure 3 1(a): A DSTN implementation scheme. The gates in the same row after placement are grouped into a cluster. Power gating cells are inserted on both sides of each row 43 Figure 3 1(b): Layout of a power gating design 43 Figure 3 2: Resistor Network modeling of a DSTN structure 45 Figure 3 3: Discharging current in a resistor network modeling 45 Figure 3 4: MIC(Ci) waveforms of AES 49 Figure 3 5: EMIC(STi,Tj) waveforms 51 Figure 3 6: MIC(Ci,Tj) waveforms of different partitions 54 Figure 3 7: Variable length n-way partitioning algorithm 55 Figure 3 8: Resistor and Capacitor network modeling for DSTN 56 Figure 3 9: Sleep transistor sizing problem formulation 59 Figure 3 10: Sleep transistor sizing algorithm 61 Figure 3 11: Step-by-step illustration of a complete iteration of our algorithm 63 Figure 3 12: MIC information of clusters in each time frame as input 64 Figure 3 13: EMIC(STi,Tj) and Slack(STi,Tj) in the second iteration 64 Figure 3 14: The implementation flow of sleep transistor sizing for DSTN 66 Figure 3 15: Sleep transistors in AES 69 List of Tables Table 2 1: Total Sleep Transistor Area 40 Table 3 1: Comparisons of Total Sleep Transistor Area and Runtime 67 Table 3 2: Maximum Instantaneous Current through Sleep Transistors 68

    [1] M. Anis, S. Areibi, and M. Elmasry, “Design and Optimization of Multithreshold CMOS (MTCMOS) Circuits,” IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, vol. 22, no. 10, pp. 1324-1342, Oct. 2003.
    [2] M. Anis, S. Areibi, M. Mahmoud, and M. Elmasry , “Dynamic and Leakage Power Reduction in MTCMOS Circuits Using an Automated Efficient Gate Clustering Technique,” Proc. of the DAC, pp. 480-485, 2002.
    [3] P. Babighian, L. Benini, and E. Macii, “Sizing and Characterization of Leakage-Control Cells for Layout-Aware Distributed Power-Gating,” Proc. of the DATE, pp. 720-721, 2004.
    [4] H. Chang and S. S. Sapatnekar, “Full-Chip Analysis of Leakage Power Under Process Variations, Including Spatial Correlations,” Proc. of the DAC, pp. 523-528, 2005.
    [5] D. S. Chiou, S. H. Chen, and S. C. Chang, “Sleep Transistor Sizing for Leakage Power Minimization Considering Charge Balancing,” accepted in IEEE Transactions on VLSI Systems.
    [6] K. Flutner, N. S. Kim, S. Martin, D. Blaauw, and T. Mudge, “Drowsy Caches: Simple Techniques for Reducing Leakage Power,” Proc. of the ISCA, pp. 148-157, 2002.
    [7] L. Guo, L. Benini, Y. Cai, Q. Zhou, L. Kang, and X. Hong, “A Novel Performance Driven Power Gating Based on Distributed Sleep Transistor Network,” Proc. of the GLSVLSI, pp. 255-260, 2008.
    [8] C. T. Hsieh, J. C. Lin, and S. C. Chang, “A Vectorless Estimation of Maximum Instantaneous Current for Sequential Circuits,” Proc. of ICCAD, pp. 537-540, 2004.
    [9] Y. M. Jiang, K. T. Cheng, and A. Kristic, “Estimation of Maximum Power and Instantaneous Current using a Genetic Algorithm,” Proc. of the CICC, pp. 135-138, 1997.
    [10] A. Kristic and K. T. Cheng, “Vector Generation for Maximum Instantaneous Current through Supply Lines for CMOS Circuits,” Proc. of the DAC, pp. 383-388, 1997.
    [11] H. Kriplani, F. Najm, and I. N. Hajj, “Pattern Independent Maximum Current Estimation in Power and Ground Buses of CMOS VLSI Circuits: Algorithms, Signal Correlations, and their Resolution,” IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, vol. 14, no. 8, pp. 998-1012, Aug. 1995.
    [12] J. Kao, S. Narendra, and A. Chandrakasan, “Subthreshold Leakage Modeling and Reduction Techniques,” Proc. of the ICCAD, pp. 141-148, 2002.
    [13] J. Kao, S. Narendra, and A. Chandrakasan, “MTCOMS Hierarchical Sizing based on Mutual Exclusive Discharge Patterns,” Proc. of the DAC, pp. 495-500, 1998.
    [14] J. Kao, A. Chandrakasan, and D. Antoniadis, “Transistor Sizing Issues and Tool for Multi-threshold CMOS Technology,” Proc. of the DAC, pp. 409-414, 1997.
    [15] C. Long and L. He, “Distributed Sleep Transistor Network for Power Reduction,” IEEE Transactions on VLSI Systems, vol. 12, no. 9, pp. 937-946, Sep. 2004.
    [16] S. Mutoh, T. Douseki, Y. Matsuya, T. Aoki, S. Shigematsu, and J. Yamata, “1-V Power Supply High-Speed Digital Circuit Technology with Multi-Threshold Voltage CMOS,” IEEE Journal of Solid-State Circuits, vol. 30, no. 8, pp. 847-854, Aug. 1995.
    [17] S. Mutoh, S. Shigematsu, Y. Matsuya, H. Fukuda, T. Kaneko, and J. Yamada, “A 1-V Multithreshold-Voltage CMOS Digital Signal Processor for Mobile Phone Application,” IEEE Journal of Solid-State Circuits, vol. 31, no. 11, Nov. 1996.
    [18] E. Pakbaznia, and M. Pedram, “Coarse-Grain MTCMOS Sleep Transistor Sizing Using Delay Budgeting,” Proc. of the DATE, pp. 385-390, 2008.
    [19] K. Roy, S. Mukhopadhyay, and H. M. Meimand, “Leakage Current Mechanisms and Leakage Reduction Techniques in Deep-Submicrometer CMOS Circuits,” Proc. of the IEEE, vol. 14, no. 2, pp. 305-327, Feb. 2003.
    [20] R. R. Rao, A. Devgan, D. Blaauw, and D. Sylvester, “Parametric Yield Estimation Considering Leakage Variability,” Proc. of the DAC, pp. 442-447, 2004.
    [21] A. Sathanur, L. Benini, A. Macii, E. Macii, and M. Poncino, “Multiple Power-Gating Domain (Multi-VGND) Architecture for Improved Leakage Power Reduction,” Proc. of the ISLPED, pp. 51-56, 2008.
    [22] K. Shi, and D. Howard, “Challenges in Sleep Transistor Design and Implementation in Low-Power Designs,” Proc. of the DAC, pp. 113-116, 2006.
    [23] K. Shi, Z, Lin, Y, Jian, and L. Yuan, “Simultaneous Sleep Transistor Insertion and Power Network Synthesis for Industrial Power Gating Designs,” Journal of Computers, vol. 3, no. 3, pp. 6-13, Mar. 2008.
    [24] S. Sirichotiyakul and et al., “Stand-by Power Minimization through Simultaneous Threshold Voltage Selection and Circuit Sizing,” Proc. of the DAC, pp. 436-441, 1999.
    [25] W. Wang, M. Anis, and S. Areibi, “Fast Techniques for Standby Leakage Reduction in MTCMOS Circuits,” Proc. of the IEEE International SOCC, pp. 21-24, 2004.
    [26] C. Y. Wang and K. Roy, “Maximization of Power Dissipation in Large CMOS Circuits Considering Spurious Transitions,” IEEE Transaction on Circuits and Systems, vol. 47, no. 4, pp. 483-490, Apr. 2000.
    [27] J. W. Tschanz, S. G. Narendra, Y. Ye, B. A. Bloechel, S. Borkar, V. De., “Dynamic Sleep Transistor and Body Bias for Active Leakage Power Control of Microprocessors,” IEEE Journal of Solid-State Circuits, vol. 38, no. 11, pp. 1838-1845, Nov. 2003.
    [28] L. Wei, Z. Chen, K. Roy, M. C. Johnson, Y. Ye, and V. K. De, “Design and Optimization of Dual-Threshold Circuits for Low-Voltage Low-Power Applications,” IEEE Transactions on VLSI Systems, vol. 7, no. 1, pp. 16-24, Mar. 1999.
    [29] Synopsys Inc. PrimePower Version-X 2005, 12 – User’s Manual.

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