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研究生: 吳亭瑩
Wu, Ting-Ying
論文名稱: 熱電致冷器熱變形之實驗與數值探討
Experimental and numerical investigation of thermal deformation of thermoelectric coolers
指導教授: 王偉中
Wang, Wei-Chung
口試委員:
學位類別: 碩士
Master
系所名稱: 工學院 - 動力機械工程學系
Department of Power Mechanical Engineering
論文出版年: 2010
畢業學年度: 98
語文別: 中文
論文頁數: 161
中文關鍵詞: 熱電致冷器電子光斑影像干涉術數位影像相關法翹曲量有限元素法
相關次數: 點閱:3下載:0
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  • 熱電致冷器(Thermoelectric Cooler, TEC)透過珀爾帖效應(Peltier Effect) 使得TEC試片在操作過程中存在溫度梯度,且因結構內部各個材料熱膨脹係數不匹配,造成電子元件間互相牽制,經過長時間反覆使用,容易導致元件破壞與損毀。
    本研究利用電子光斑影像干涉術(Electronic Speckle Pattern Interferometry, ESPI)和數位影像相關(Digital Image Correlation, DIC)法兩種光學量測方法進行TEC變形量量測。本研究嘗試31對與127對兩種不同尺寸的TEC試片,以單邊夾持、中心支撐與雙面固定三種不同的夾持方式,研究獲得TEC試片在不同輸入電流造成之變形資訊。本研究結果顯示兩陶瓷板間的溫差與平面外位移關係為線性,且翹曲量(Warpage)不會因TEC試片不同的變形狀態(熱面膨脹冷面收縮狀態與冷面和熱面皆處於膨脹狀態)而有所改變,只與冷熱面的溫差有關。
    本研究亦以有限元素法套裝軟體ANSYS 12.1建立31對TEC試片有限元素模型,搭配中心支撐之夾持方式,成功的比對了實驗與數值模擬結果,並藉由數值模擬瞭解TEC試片內部應力分佈的狀況。


    目 錄 I 圖目錄 V 表目錄 XVI 一、簡介 I 二、文獻回顧 4 2.1 電子光斑影像干涉術 4 2.2 數位影像相關法 5 2.3 熱電致冷器 7 三、實驗原理 9 3.1 靜態電子光斑影像干涉術 9 3.1.1 平面內位移 11 3.1.2 平面外位移 15 3.2 相位移原理 18 3.3數位影像相關法原理 21 3.3.1 位移與變形 21 3.3.2 相關函數 23 3.3.3 牛頓-拉福森法 25 3.3.4 影像重建 29 3.3.5 三維數位影像相關法 30 四、試片規劃與實驗裝置 34 4.1 試片規劃 34 4.1.1 TEC試片擺放方式 34 4.1.2中心支撐之TEC試片 36 4.1.3單邊夾持之TEC試片 37 4.1.4雙面夾持之TEC試片 38 4.2 實驗裝置 38 4.2.1 ESPI實驗裝置 38 4.2.2 DIC實驗裝置 40 4.2.3其它實驗設備 41 五、實驗程序 42 5.1 試片前處理 42 5.2 實驗條件 43 5.3 ESPI實驗程序 43 5.4 DIC實驗程序 44 5.4.1 2D-DIC法實驗程序 44 5.4.2 3D-DIC法實驗程序 44 5.5 ANSYS軟體模擬分析程序 45 5.5.1建立模型及給定材料 46 5.5.2網格的建立 46 5.5.3邊界條件 47 5.5.4後處理 47 六、結果與討論 48 6.1 DIC法架設方式之探討 48 6.2 單邊夾持TEC試片之探討 50 6.2.1 ESPI實驗結果 51 6.2.2 3D-DIC法實驗結果 53 6.2.3結合ESPI與3D-DIC法實驗結果 55 6.3 中心支撐TEC試片之探討 56 6.3.1實驗條件設定之探討 56 6.3.2 31對TEC試片實驗結果 58 6.3.3 127對TEC試片實驗結果 59 6.3.3.1 3D-DIC法系統誤差探討 59 6.3.3.2 狀態A結果分析 60 6.3.3.3 狀態B結果分析 62 6.3.3.4 狀態A與狀態B結果比較 63 6.4 雙面夾持TEC試片之探討 64 七、結論與未來展望 68 7.1結論 68 7.2未來展望 70 八、參考文獻 73

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